A Research for High Efficiency X-Ray Spectrometers Using Multilayers

多层膜高效X射线光谱仪的研究

基本信息

  • 批准号:
    62540190
  • 负责人:
  • 金额:
    $ 1.09万
  • 依托单位:
  • 依托单位国家:
    日本
  • 项目类别:
    Grant-in-Aid for General Scientific Research (C)
  • 财政年份:
    1987
  • 资助国家:
    日本
  • 起止时间:
    1987 至 1988
  • 项目状态:
    已结题

项目摘要

For a high efficiency X-ray spectrometer, we introduced a new method using etalon. Multilayers have a merit which can be freely designed the structure. Inserting a spacer between regularly piled layers, we can make a etalon. Furthermore, we can control the characteristics of the reflectivity of etalon, changing the thickness of the spacer. Using suitable etalons, we can get a fourier transformed signals of the X-ray spectrum and we can reconstruct the X-ray spectrum with inverse fourier transforms of the signals. We showed the validity of this method by a computer simulation.To get a basic data of the multilayers, we fabricated various thickness multilayers consisting of Ni and C, and evaluated the reflectivity. We found that it is difficult to make a high reflectivity multilayers with the thickness of less than 100A and found that its cause is roughness of the layers of about 10A (r.m.s). On the basis of this results, we fabricated etalons consisting Ni and C and evaluated the characteristics of reflectivity using characteristic X-rays and synchrotron orbital radiators. We found that the etalons have a roughly designed characteristics.We also developed a position sensitive proportional counter and evaluated its characteristics. We found that our position sensitive proportional counter has about 2 mm position resolution and 18% energy resolution for 5.9 keV X-rays. It is possible to make a high efficiency X-ray spectrometer using our position sensitive proportional counter and etalons.
针对高效率X射线谱仪,提出了一种新的标准具测量方法。多层膜具有可以自由设计结构的优点.在规则堆积的层之间插入一个间隔物,我们就可以制造一个标准具。此外,我们可以控制标准具的反射率特性,改变间隔物的厚度。利用合适的标准具,我们可以得到X射线光谱的傅里叶变换信号,并通过对信号的逆傅里叶变换重建X射线光谱。为了得到多层膜的基本数据,我们制备了不同厚度的Ni和C多层膜,并对多层膜的反射率进行了评估。我们发现,很难制作厚度小于100埃的高反射率多层膜,并发现其原因是约10埃(r.m.s)的层的粗糙度。在此结果的基础上,我们制造了由Ni和C组成的标准具,并使用特征X射线和同步加速器轨道辐射器评估了反射率特性。我们还研制了一个位置灵敏正比计数器,并对其特性进行了评价。我们发现,我们的位置敏感正比计数器具有约2毫米的位置分辨率和18%的能量分辨率为5.9 keV的X射线。利用我们研制的位置灵敏正比计数管和标准具,可以制成高效率的X射线谱仪。

项目成果

期刊论文数量(20)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
Adrian,Ottewill: Progress of Theoretical Physics. 77. 310-321 (1987)
阿德里安·奥特威尔:理论物理学进展。
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    0
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  • 通讯作者:
Shinichi,TADAKI: Progress of Theoretical Physics. 77. 671-680 (1987)
忠木真一:理论物理学进展。
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  • 影响因子:
    0
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  • 通讯作者:
Kousuke,SHIZUME: Progress of Theoretical Physics. 79. No.3 (1988)
静目浩介:理论物理学进展。
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    0
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KITAMOTO Shunji其他文献

KITAMOTO Shunji的其他文献

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{{ truncateString('KITAMOTO Shunji', 18)}}的其他基金

Development of a New X-ray Interferometer for Astronomical Usage.
开发用于天文用途的新型 X 射线干涉仪。
  • 批准号:
    22654025
  • 财政年份:
    2010
  • 资助金额:
    $ 1.09万
  • 项目类别:
    Grant-in-Aid for Challenging Exploratory Research
Development of an Ultra-High-Angular-Resolution X-Ray Telescope and an X-Ray Interferometer
超高角分辨率X射线望远镜和X射线干涉仪的研制
  • 批准号:
    19340047
  • 财政年份:
    2007
  • 资助金额:
    $ 1.09万
  • 项目类别:
    Grant-in-Aid for Scientific Research (B)
Development of an X-Ray Spectrometer with High-Throughput and High Resolving Power
高通量、高分辨率X射线光谱仪的研制
  • 批准号:
    09640320
  • 财政年份:
    1997
  • 资助金额:
    $ 1.09万
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)

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  • 批准号:
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  • 财政年份:
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