Electronic Structures of Atom Aggregates Studied by Photoelectron Spectroscopy using Synchrotron Radiation

本研究的目的是利用同步辐射光谱学技术（光电子、吸收、光电离、光脱附光谱）研究原子聚集体的电子结构，如微团簇和表面吸收的原子和分子。为了完成这些实验，我们搭建了特高压兼容型样品制备室、计算机控制的光电子光谱和光电离光谱测量系统以及数据分析软件。这些系统已被引入光子工厂的19A束流线，2.5 GeV的电子和正电子存储环，并用于实验。其中一个初步结果表明，同步辐射产生的大量光子强度非常适合于这样一个小原子系统的光谱研究，特别是来自Revolver波动器的同步辐射将使我们获得比目前所获得的更精确的电子结构信息。我们还测量了Cs原子在Si表面吸收的光电子能谱，获得了Si表面电子能带结构的信息。

The aim of this work is to investigate the electronic structures of atom aggregates, such as microclusters and atom and molecules absorbed on surfaces, with spectroscopic technichs (photoelectron, absorption, photoionization, photodesorption spectroscopy) using synchrotron radiation. To accomplish those experiments, we have constructed the sample preparation chamber of UHV compatible type, computer controlled measuring system for photoelectron and photoionization spectra and softwares for data analyzes. These system have been brought into the Beamline 19A at the Photon Factory, 2.5 GeV electron and positron storage ring, and used for experiments.The one of the preliminary results show large amount of photon intensity from the sychrotron radiation si quite suitable for spectroscopic investigations of such a small atomic system, and especially the synchrotron radiation from Revolver undulator will enable us to obtain more precise information on the electronic structures than we obtained so far. We also have measured the photoelectron spectra of Cs atoms absorbed on Si surface and obtained informations on surface electronic band structure.