Development of Neutron-induced Secondary Charged Particle Spectrometer Based on Two-dimensional E-TOF Analysis

基于二维E-TOF分析的中子感生二次带电粒子谱仪的研制

• 批准号: 63880029
• 负责人: TAKAHASHI Akito
• 金额: $ 5.95万
• 依托单位: Osaka University, Faculty of Engineering
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Developmental Scientific Research (B).
• 财政年份: 1988
• 资助国家: 日本
• 起止时间: 1988 至 1990
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-63880029/
• 关键词: secondary charged particle; spectrum; E-TOF; two-dimensional analysis; shielding; pulse shape discrimination; proton; alpha-particle; 中性子反応二次荷電粒子; エネルギ-スペクトル; 粒子弁別; EーTOF二次元分析; E-ToF; 14MeV中性子; CsI; 中性子反応; 荷電粒子スペクトル; EーTOF分析装置; 開発; CsIシ

Energy-spectral data of charged particles induced by neutron reactions are of fundamental importance for evaluating nuclear heating and material manage in fusion devices. Because of the difficulty in measuring techniques, only few data have been accumulated up to now in the world and the vedelopment of new spectrometers are therefore desired. In this study, a secondary charged particle spectrometer based on two-dimensional E-TOF analysis has been designed, fabricated and tested. Major problem to have overcome was how to sufficiently reduce background signals induced by detector itself and surrounding structural materials. Investigations were undertaken by testing various detectors, optimizing shielding configuration and adopting the pulse shape discrimination technique. Finally a spectrometer with satisfactory background reduction was developed. Using the developed spectrometer, proton and alpha-particle spectra by 14 MeV neutron reactions with Al target were measured for demonstration. The obtained spectra agreed well with the only existing data by Grimes and with the theoretically calculated ones. Conclusively, we can say that a satisfactory spectrometer has been developed.

中子反应诱导带电粒子的能谱数据对于评价核聚变装置中的核加热和材料管理具有重要的基础意义。由于测量技术的困难，迄今为止国际上积累的数据很少，因此需要开发新的光谱仪。本研究设计、制作并测试了基于二维E-TOF分析的二次带电粒子谱仪。需要克服的主要问题是如何充分减少探测器本身和周围结构材料引起的背景信号。通过测试各种探测器，优化屏蔽结构和采用脉冲形状识别技术进行了研究。最后研制出了具有满意背景还原性能的光谱仪。利用研制的能谱仪，测量了14 MeV中子与Al靶反应的质子谱和粒子谱。所得的光谱与Grimes现有的数据和理论计算的光谱吻合得很好。最后，我们可以说研制出了令人满意的光谱仪。

项目成果

S.Ogino,A,Takahashi.: "Secondary charged particle spectrometer based on twodimensional EーTOF analysis" JAERIーM. 90ー025. 268-285 (1990)

S.Ogino,A,Takahashi.：“基于二维 E-TOF 分析的二次带电粒子光谱仪”JAERI-M 90-025 (1990)。

S. Ogino and A. Takahashi: "Secondary charged particle spectrometer based on two-dimensional E-TOF analysis (II)" JAERI-M.

S. Ogino 和 A. Takahashi：“基于二维 E-TOF 分析的二次带电粒子光谱仪（II）” JAERI-M。

S.OGINO and A.TAKAHASHI: "Secondary charged particle spectrometer based on two dimensional EーTOF analysis(II)" JAERIーM. (1991)

S.OGINO 和 A.TAKAHASHI：“基于二维 E-TOF 分析的二次带电粒子光谱仪（II）” JAERI-M（1991）。

荻野誠司,高橋亮人: "Secondary Charged Particle Spectrometer Based on E-TOF Two-Dimeusional Analysis" JAERI-M.

Seiji Ogino、Ryoto Takahashi：“基于 E-TOF 二维分析的二次带电粒子光谱仪”JAERI-M。

S.Ogino,A.TaKahashi: "Secondary chaiged particle spectrometer based on twodimensional EーTOF analysis(II)" JAERIーM. (1991)

S.Ogino，A.TaKahashi：“基于二维 E-TOF 分析的二次粒子光谱仪（II）”JAERI-M（1991）。