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Investigation on Insulating Degradation of Heat Resistant Organic Materials by Irradiation

耐热有机材料辐照绝缘降解研究

基本信息

批准号：
01550229
负责人：
FUJITA Shigetaka
金额：
$ 1.02万
依托单位：
Hachinohe Institute of Technology
依托单位国家：
日本
项目类别：
Grant-in-Aid for General Scientific Research (C)
财政年份：
1989
资助国家：
日本
起止时间：
1989 至 1990
项目状态：
已结题

项目摘要

In this study, physicochemical and dielectric breakdown characteristics of heat resistant organic materials gamma ray-irradiated were investigated.Samples used are perfluoroalkoxy (PFA), fluorinated-ethylene-propylene (FEP), polyetheretherketone (PEEK) and epoxy resin (EPX). Irradiation was carried out by gamma ray (0.258kC/kg・h) in air at room temperature.From results of physicochemical analyses, it was found that the amount of free radicals of PFA and FEP increased at 0.01MGy irradiation and oxidation reactions occurred by chain scission. A structure of PEEK didn't change up to 5MGy irradiation.Dielectric breakdown characteristics of PFA and FEP films decreased with increasing irradiation dose, especially changed at 0.15MGy irradiation rapidly. But, those of PEEK film didn't change up to 5MGy irradiation. On the other hand, dielectric breakdown characteristics of EPX tended to decrease at 2MGy irradiation.Next, dielectric breakdown characteristics of PFA cable decreased rapidly at 0.2MGy irradiation, but, those of FEP cable didn't change up to 0.2MGy irradiation. Dielectric breakdown characteristics of PEEK cable didn't change up to 5MGy irradiation.Irradiation resistant characteristics of EPX existed between FEP and PEEK. Irradiation dose that dielectric breakdown characteristics of PFA and FEP cables (thickness : 0.5mm) decreased rapidly was high compared with PFA and FEP films (thickness : 50um). This fact indicates the depth of oxidation degradation is shallow from the surface of samples.

本研究以全氟烷氧基（PFA）、氟化乙烯丙烯（FEP）、聚醚醚酮（PEEK）和环氧树脂（EPX）为材料，研究了它们在γ射线辐照下的物理化学和介电击穿特性。在室温空气中用γ射线（0.258kC/kg·h）辐照，理化分析结果表明，在0.01MGy辐照下，PFA和FEP的自由基含量增加，发生断链氧化反应。在5 MGy辐照下，PEEK的结构没有发生变化，PFA和FEP薄膜的介电击穿特性随辐照剂量的增加而降低，特别是在0.15MGy辐照下，介电击穿特性发生急剧变化。而PEEK薄膜在5 MGy辐照后，其光致变色性能基本不变。而EPX在2 MGy辐照时，其绝缘击穿特性有下降的趋势，PFA电缆在0.2MGy辐照时，其绝缘击穿特性迅速下降，而FEP电缆在0.2MGy辐照时，其绝缘击穿特性基本不变。在5 MGy的辐照下，PEEK电缆的绝缘击穿特性没有发生变化，在FEP和PEEK之间存在EPX的耐辐照特性。与PFA和FEP薄膜（厚度为50 μ m）相比，PFA和FEP薄膜（厚度为0.5mm）电缆的介质击穿特性迅速下降的辐照剂量较高。这一事实表明，氧化降解的深度是从样品的表面浅。