Shearing Interferometers using diffraction gratings as elements wavefront division
Shearing Interferometers using diffraction gratings as elements wavefront division
批准号:
07650056
负责人:
IWATA Koichi
金额:
$1.47万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
1995
资助国家:
日本
项目状态:
已结题
起止时间:
1995 至 1996
中文摘要
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英文摘要
We developed two types of shearing interferometers using diffraction gratings. The one uses a double period diffraction grating. The grating has two periods which are very close to each other. The other interferometer uses four diffraction gratings with the same grating period.In the double period grating system, the difference in diffraction angles produces shearing images. Moreover, since a periodic fringe pattern appears on the shearing image due to the difference in diffraction angles, phase distribution of the interference fringes can be analyzed accurately with a help of Fourier analysis. We made an shearing system with the double period grating for optical CT to measure refractive-index distribution of a phase object. Moreover some discussions were made about errors in refractive-indices reconstructed from the shearing interferometer and the conventional two-beam interferometer. The discussion results an advantage of the sharing type used for the optical CT system.On the other h … More and, we proposed a white light-shearing interferometer using the four diffraction gratings. Sensitivity of a shearing interferometer is proportional to amount of the shear, and the shear amount depends on the diffraction angle which is in proportion to the wavelength of light approximately in case of a small diffraction angle. When the shear image is produced by using a couple of the gratings with a small separation, the phase difference between the interfering light beams does not depend on the wavelength of light. Then the shearing interferometer for a white light source is realized by setting the couple of gratings in front and back of the phase object. We made a simple sharing interferometer with 4 gratings and a halogen light source. The obtained interference fringes pattern did not allow coherent noise and the fringe contrast was close to 0.5 which corresponded to the ideal value. The phase shift technique for a sensitive phase analysis was realized by moving one of the gratings.Moreover, the idea of the four gratings system is applied to X-ray interferometer. We made a X-ray interferometer with four silicon thin-blade which are made from a single domain silicon crystal. Less
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菊田,中野,岩田: "透過型光CT法による屈折率分布計測における微分干渉法と二光束干渉法の比較" 日本機会学会論文集.
Kikuta、Nakano、Iwata:“使用透射光学 CT 方法测量折射率分布时微分干涉测量法和两光束干涉测量法的比较”日本机械工程师学会会议录。
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通讯作者:
T.Nakano, H.Hagino, H.Kikuta, K.Iwata: "Analysis of X-ray interferometers for phase distribution measurement" Proceeding of 17th Congress of ICO. SPIE 2778. 17-18 (1996)
T.Nakano、H.Hagino、H.Kikuta、K.Iwata:“用于相位分布测量的 X 射线干涉仪分析”ICO 第 17 届大会论文集。
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菊田,中山,谷口,中野,岩田: "回折格子を用いた微分干渉計による屈折率再生光CT" 日本機会学会論文集. 62・599C. 2627-2632 (1996)
Kikuta、Nakayama、Taniguchi、Nakano、Iwata:“使用衍射光栅的差分干涉仪的折射率恢复光学 CT”,日本机械工程师学会论文集 62・599C (1996)。
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H.Kikuta, T.Nakano, K.Iwata: "Comparison of two-beam and differential interferometries for measurements of refractive-index distributions by the optical CT technique" Transactions of the Japan Society of Mechanical Engineers. (in print). (1997)
H.Kikuta、T.Nakano、K.Iwata:“光学 CT 技术测量折射率分布的双光束干涉仪和微分干涉仪的比较”日本机械工程师学会会刊。
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菊田, 中野, 岩田: "透過型光CT法による屈折率分布計測における微分干渉法と二光束干渉法の比較" 日本機械学会論文集.
Kikuta、Nakano、Iwata:“使用透射光学 CT 方法测量折射率分布时微分干涉测量法和两光束干涉测量法的比较”日本机械工程学会会刊。
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依托单位:
海外基金