Three dimensional structure analysis of advanced materials by electron microscope images of successive thin sections

通过连续薄片的电子显微镜图像对先进材料进行三维结构分析

• 批准号: 07805061
• 负责人: SHINDO Daisuke
• 金额: $ 1.22万
• 依托单位: Tohoku University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (C)
• 财政年份: 1995
• 资助国家: 日本
• 起止时间: 1995 至 1996
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-07805061/
• 关键词: Electron Microscope; Ultramicrotomy; Imaging Plate; Thin Section; Image Analysis; 3次元構造解析

The purpose of this study is the establishment of three dimensional structure analysis using ultramicrotomy and image processing. First of all, we found the optimum slice conditions for ultramicrotomy of ion oxide small particles. Actually we succeeded in obtaining successive thin section with several ten nm in thickness. Then we carried out high-resolution electron microscopy with a high-voltage high resolution electron microscope in Tohoku University. In order to accurately record the high-resolution images, we used a new recording system, i.e., the imaging plates. We also carried out the imaging processing using Tohoku University computer network system TAINS and SUPER-TAINS.Through these studies, we clarified internal structure of monodisperse ion oxides with various shapes, such as platelet-type, peanut-type and pseudocubic type. We also applied this method to CdS monodisperse particles and succeeded in clarifying their internal and external structure.

这项研究的目的是建立了使用超微切开术和图像处理的三维结构分析。首先，我们发现了离子氧化物小颗粒的超骨切开术的最佳切片条件。实际上，我们成功地获得了连续的薄截面，其厚度为10 nm。然后，我们使用高压大学的高压高分辨率电子显微镜进行了高分辨率电子显微镜。为了准确记录高分辨率图像，我们使用了一个新的记录系统，即成像板。我们还使用Tohoku University网络系统的tains and Super-tains进行了成像处理。通过这些研究，我们阐明了具有各种形状的单分散氧化物的内部结构，例如血小板型，花生型和伪观察类型。我们还将此方法应用于CDS单分散粒子，并成功阐明了它们的内部和外部结构。

项目成果

T.Oikawa: "Evaluation Methed for Imaging Plate Resotution by Meansof Phase Contrast Transfer Function" Proc.Microscopy and Microanalysis. 662-663 (1995)

T.Oikawa：“通过相衬传递函数评估成像板分辨率”Proc.Microscopy 和 Microanalysis。

A.Taniyama: "Sensitivity and Fading Characteristics of the 25 mm Pixel Size Imaging Plate for Transmission Electron Microscopy" Journal Electron Microscopy. 45. 232-235 (1996)

A.Taniyama：“透射电子显微镜用 25 毫米像素尺寸成像板的灵敏度和褪色特性”电子显微镜杂志。

G. S. Park: "Evaluation of a Spherical Aberration Constant of the Objective Lens of HVEM at Tohoku University" Journal of Electron Microscopy. 45. 152-158 (1996)

G. S. Park：“东北大学 HVEM 物镜球面像差常数的评估”《电子显微镜杂志》。

G.S.Park: "Internal Structure Analysis of Monodispersed Pseudocubic Hematite Particles by Electron Microscopy" Journal of Colloid and Interface Sirence. 177. 198-207 (1996)

G.S.Park：“通过电子显微镜对单分散拟立方赤铁矿颗粒进行内部结构分析”胶体与界面警报杂志。

A.Taniyama: "Sensitivity and Fading Characterishics of the 25um Pixel Size Imaging Plate for Transmission Electron Microscopy" Journal of Electron Microscopy. 45. 232-235 (1996)

A.Taniyama：“透射电子显微镜用 25um 像素尺寸成像板的灵敏度和衰落特性”电子显微镜杂志。