Development of electron holography system for photoexcitation phenomena and its application to materials science

光激发现象电子全息系统的研制及其在材料科学中的应用

• 批准号: 19106002
• 负责人: SHINDO Daisuke
• 金额: $ 75.21万
• 依托单位: Tohoku University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (S)
• 财政年份: 2007
• 资助国家: 日本
• 起止时间: 2007 至 2011
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-19106002/
• 关键词: 電子顕微鏡; ホログラフィー; 光励起現象; 帯電現象; 絶縁体; 磁性体; 電磁場; 電子線ホログラフィー; 光励起; 電子材料; 生体材料; 二次電子; 物理計測・制御; レーザー; 電子の干渉

We have developed a new apparatus that enables laser exposure to specimens within a transmission electron microscope, and established the methods for analyzing photoexcitation phenomena via electromagnetic field visualization using electron holography. These methods have revealed the process of laser-induced change in the carrier density in an organic photoconductor, in addition to the charging phenomena and/or magnetization process in other advanced materials.

我们开发了一种新的装置，使激光暴露于透射电子显微镜下的标本，并建立了利用电子全息术通过电磁场可视化分析光激发现象的方法。这些方法揭示了有机光导体中激光诱导载流子密度变化的过程，以及其他先进材料中的充电现象和/或磁化过程。

项目成果

Microstructure and magnetic property of electroless-plated CoNiFeB soft underlayer

• DOI: 10.1016/j.jmmm.2008.08.056
• 发表时间: 2008-11
• 期刊: Journal of Magnetism and Magnetic Materials
• 影响因子: 2.7
• 作者: W. Xia;Joo-Kyun Kim;T. Yogo;D. Shindo;M. Ito;K. Ohashi

Local temperature measurements on nanoscale materials using a movable nanothermocouple assembled in a transmission electron microscope

• DOI: 10.1088/0957-4484/22/48/485707
• 发表时间: 2011-12
• 期刊: Nanotechnology
• 影响因子: 3.5
• 作者: N. Kawamoto;Ming‐Sheng Wang;Xianlong Wei;Daiming Tang;Y. Murakami;D. Shindo;M. Mitome;D. Golberg

TEM study of local conduction mechanisms in model specimens of Ag-based conductive adhesives

银基导电粘合剂模型样品局部传导机制的 TEM 研究

• 发表时间: 2011
• 期刊: IEEE Trans. Components, Packaging and Manufacturing Tech
• 作者: K. Kurosu;N. Kawamoto;Y. Murakami and D. Shindo
• 通讯作者: Y. Murakami and D. Shindo

Precise resistivity measurement of submicrometer-sized materials by using TEM and microprobes

使用 TEM 和微探针精确测量亚微米尺寸材料的电阻率

• 发表时间: 2009
• 期刊: Mater. Trans.
• 作者: N. Kawamoto;Y. Murakami;D. Shindo;H. Azehara and H. Tokumoto
• 通讯作者: H. Azehara and H. Tokumoto

Observation of magnetic domain structure in Fe_<81> B_<15> Si_4 amorphous alloy by Lorentz microscopy and electron holography

洛伦兹显微镜和电子全息观察Fe_<81>B_<15>Si_4非晶合金磁畴结构

• 发表时间: 2009
• 期刊: Mater. Trans.
• 作者: M. Hiraoka;Z. Akase;D. Shindo;Y. Ogawa and Y. Yoshizawa
• 通讯作者: Y. Ogawa and Y. Yoshizawa