Real-Time Analysis of Surface Reaction by X-Ray Photoemission Electron Microscope

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The goal of this project is to observe reaction on solid surface in-situ by X-ray photoelectron emission microscope. We have disigned and constructed a X-ray photoelectron emission microscope (XPEEM). By adding a Wien filter for energy selection of X-ray excited photoelectron to an existing low-energy electron microscope (LEEM), it is possible to image the spatial distribution of a particular element at a particular chemical shift on a solid surface. A spatially-resolved total photoelectron image of a silicon wafer and energy spectrum of Au (4f) emission have been successfully observed with the microscope.As the optimization of the XPEEM,surface reaction at titanium oxide and silicon oxide model catalysts has been observed in-situ by scanning tunneling microscope (STM) and reflection absorption infrared spectroscopy (RAIRS). By combining those techniques with XPEEM,the real-time visualization of surface reaction will be achieved.