SELF-FORMATION OF GERMANIUM NANOCRYSTALS AND ITS APPLICATION TO SELF-ADAPTIVE NEURAL DEVICES
SELF-FORMATION OF GERMANIUM NANOCRYSTALS AND ITS APPLICATION TO SELF-ADAPTIVE NEURAL DEVICES
批准号:
11650310
负责人:
FUKUDA Hisashi
金额:
$1.22万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
1999
资助国家:
日本
项目状态:
已结题
起止时间:
1999 至 2000
中文摘要
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英文摘要
Metal-oxide-semiconductor (MOS) structures with a Ge nanocrystal embedded in SiO_2 films were fabricated by Ge^+ ion implantation and subsequent high-temperature annealing. The Raman spectra indicate the evidence of self-assembled Ge nanocrystals in the SiO_2 films. The Ge size and its density were estimated to 3-5 nm and 1×10^<12>/cm^2, respectively. Photoluminescence spectra showed a strong blue-violet band around 400 nm and a weak near-infrared band around 750 nm, respectively. The several implantation-induced deficient centers are believed to be responsible for the blue-light luminescence. Capacitance-voltage characteristics exhibit the flat-band voltage shifts of 1.02 V after the electron injection into the SiO_2/Ge/SiO_2 potential well. An anomalous leakage current was clearly observed in the current-voltage characteristics. The precise simulation of quantum electron transport in the SiO_2 film indicates that the anomalous conduction is originated from resonant tunneling in the SiO_2/Ge/SiO_2 double-well band structure.
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福田永: "酸化膜中のナノスケールGe微結晶成長についての検討"第47回応用物理学関係連合講演会予稿集. (発表予定).
福田英二:《氧化膜中纳米级Ge微晶的生长研究》第47届应用物理协会会议论文集(待提交)。
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山田友和: "シリコン酸化膜中のゲルマニウム微結晶成長と電気的特性評価"平成12年電子情報通信学会技術報告. 13 (2000)
Tomokazu Yamada:“氧化硅薄膜中的锗微晶生长及其电性能评价”2000年IEICE技术报告13(2000)。
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T.Yamada, H.Fukuda and S.Nomura: ""Characterization of Ge Nanocrystals Embedded in SiO_2 Films" (in Japanese)"The Transaction of the Institute of Electronics, Information and Communication Engineers. Vol.CPM2000-86, No.272. 13-18 (2000)
T.Yamada、H.Fukuda 和 S.Nomura:““嵌入 SiO_2 薄膜中的 Ge 纳米晶体的表征”(日文)”电子、信息和通信工程师学会会刊。
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Hisashi Fukuda: "Characterization of Ge Nanocrystals Embedded in SiO_2 Films"Meeting Abstracts on the 199^<th> Meeting of the Electrochemical Society,2001,Washington DC. (2001年3月27日発表予定). (2001)
Hisashi Fukuda:“SiO_2 薄膜中嵌入的 Ge 纳米晶体的表征”电化学学会第 199 次会议摘要,2001 年,华盛顿特区(计划于 2001 年 3 月 27 日发表)。
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H.Fukuda, S.Sakuma, T.Yamada, S.Nomura, M.Nishino, T.Higuchi and S.Ohshima: "Characterization of Ge Nanocrystals Embedded in SiO_2 Films"25^<th> International Conference on the Physics of Semiconductors (Osaka). 85 (2000)
H.Fukuda、S.Sakuma、T.Yamada、S.Nomura、M.Nishino、T.Higuchi 和 S.Ohshima:“表征嵌入 SiO_2 薄膜中的 Ge 纳米晶体”第 25 届国际半导体物理会议
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共 26 条
Fabrication of organic semiconductor memory and application to neural network circuit
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批准号:25420310
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$3.24万
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财政年份:2013
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负责人:FUKUDA Hisashi
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依托单位:
Studies on Semiconductor Nanostructure Formed by Low-temperature Chemical Vapor Deposition and Application to Nanodevices
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批准号:17510107
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$2.02万
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财政年份:2005
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负责人:FUKUDA Hisashi
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依托单位:
SELF-FORMATION OF GERMANIUM NANOCRYSTALS AND ITS APPLICATION TO SELF-ADAPTIVE NEURAL DEVICES
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批准号:13650328
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$1.34万
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财政年份:2001
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负责人:FUKUDA Hisashi
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依托单位: