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Development of the measuring system for correlated thermal diffuse scattering using a low energy electron diffraction optics

使用低能电子衍射光学器件开发相关热漫散射测量系统

基本信息

批准号：
12354003
负责人：
ABUKAWA Tadashi
金额：
$ 18.39万
依托单位：
Tohoku University
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (A)
财政年份：
2000
资助国家：
日本
起止时间：
2000 至 2001
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-12354003/
关键词：
Thermal Diffuse Scattering Surface structure Vibration correlation LEED Patterson function Direct method Solid surface 低速電子回折

项目摘要

The purpose of this research project is the development of the experimental system that realizes the surface structure method of the correlated thermal diffuse scattering (CTDS) using a standard low energy electron diffraction (LEED) optics. The utilization of the widespread LEED optics help the CTDS method come into wide use in surface science. First, we constructed an apparatus of CTDS-LEED, which were equipped with a LEED optics, a 5-axes sample manipulator and a CCD video camera. The functions of the LEED optics and image acquisition are controlled by a personal computer. We have confirmed that the system holds the enough performance to measure CTDS. Furthermore, we have made a computer program to automate the CTDS measurements, and a program to analyze the surface structure from CTDS data. We can access most of the diffraction feature, i.e. Bragg spots, CTDS and other diffuse structures, using these programs. With the present system and programs, the data acquisition efficiency have increased to 10 or 100 times of that using the previous system. The surface structure analysis was performed for Si(111)4x1-In surface using the present system. The high performance of the present system have been confirmed as a surface structural tool. In order to spread the present method (CTDS-LEED) for surface analysis, we will widely open the present results and will distribute the programs for measurements and analysis.

本研究计画的目的是发展一套实验系统，以标准低能电子绕射（LEED）光学系统实现相关热扩散散射（CTDS）的表面结构方法。广泛应用的LEED光学器件的使用使CTDS方法在表面科学中得到了广泛的应用。首先，我们建立了一个CTDS-LEED装置，它配备了LEED光学系统，一个五轴样品机械手和一个CCD摄像机。LEED光学和图像采集的功能由个人计算机控制。我们已经证实，该系统具有足够的性能来衡量CTDS。此外，我们还编制了一个计算机程序，使CTDS测量自动化，并编制了一个程序，从CTDS数据分析表面结构。利用这些程序，我们可以获得大部分的衍射特征，即布拉格斑点、CTDS和其他漫射结构。使用本系统和程序，数据采集效率提高到使用以前的系统的10倍或100倍。利用该系统对Si（111）4x 1-In表面进行了表面结构分析。本系统的高性能已被证实为表面结构工具。为了推广本方法（CTDS-LEED）进行表面分析，我们将广泛公开现有的结果，并将分发测量和分析程序。