Study of Surface Structure by means of Correlated Thermal Diffuse Scattering.

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The purpose of this research project is the accurate surface structure investigation using a recently developed technique, the correlated thermal diffuse scattering (CTDS). Characteristics and weak points of the methods have been investigated to improve the performance. Then the new two-dimensional detection system for diffraction patterns has been constructed. The system consists of a chilled CCD video camera, a high dynamic range video frame grabber and a personal computer. The new detection system speeds up the data acquisition time more than 8 times of those using the previous system, and enables to access a large volume of the diffraction data, which is crucial for the accurate structural investigation. Si (001) 2x1 surface and Si (111) root3 x root3 surface have been investigated by the CTDS using the new detection system The surface structures of both surfaces are clearly reconstructed by CTDS, and the results are consistent with those for previous studies by other methods. The comparison between the present and previous indicates the high structural accuracy, which is about 0.1A, of the present CTDS.