Stress Intensity Factor Analysis of an Interface Crack between Anisotropic Dissimilar Materials under Thermal Stress
热应力下各向异性异种材料界面裂纹的应力强度因子分析
基本信息
- 批准号:12650091
- 负责人:
- 金额:$ 1.47万
- 依托单位:
- 依托单位国家:日本
- 项目类别:Grant-in-Aid for Scientific Research (C)
- 财政年份:2000
- 资助国家:日本
- 起止时间:2000 至 2001
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
The stress intensity factors of an interface crack between dissimilar materials are important parameters for the evaluation of the integrity of electronic devices, adhesive structures and composite materials. We must use a numerical technique like the finite element method to analyze the stress intensity factors of an interface crack in an actual structure. In this study, we developed a numerical technique to analyze stress intensity factors of an interface crack between dissimilar materials under thermal stress. Final object of this study is to develop the anisotropic version of this method and the application to the evaluation of the reliability of electronic devices. We carried out several works as follows.(1) We modified the virtual crack extension method and the crack closure integral method for an interface crack between dissimilar materials under thermal stress condition. We demonstrated that the both methods is one of the most accurate methods to calculate the stress intensity factors of an interface crack.(2) The direction of the kinking of an interface crack can be predicted using the maximum hoop stress criterion that is derived from stress intensity factors of an interface crack.(3) We applied the stress intensity factors of an interface crack to evaluate the delamination between dissimilar materials used in semiconductor chips.(4) We developed a computer code to calculate the asymptotic solution of the stress distribution around an interface crack between dissimilar anisotropic materials using the Stroll formalism. This is the most important step to develop the numerical technique to calculate stress intensity factors of an interface crack between anisotropic dissimilar materials. We also derived the analytical solution of the stress intensity factors of a center interface crack between jointed semi-infinite anisotropic plates under uniform tension and shear.
异种材料界面裂纹的应力强度因子是评价电子器件、粘接结构和复合材料完整性的重要参数。要分析实际结构中界面裂纹的应力强度因子,必须使用类似有限元的数值方法。在这项研究中,我们发展了一种数值技术来分析热应力下不同材料之间的界面裂纹的应力强度因子。这项研究的最终目的是发展这种方法的各向异性版本,并将其应用于电子设备的可靠性评估。具体工作如下:(1)对热应力条件下异种材料界面裂纹的虚裂纹扩展方法和裂纹闭合积分方法进行了改进。我们证明这两种方法都是计算界面裂纹应力强度因子最准确的方法之一。(2)根据界面裂纹的应力强度因子推导出的最大环向应力准则可以预测界面裂纹的弯曲方向。(3)将界面裂纹的应力强度因子应用于评估半导体芯片中不同材料之间的分层。(4)开发了一个计算机程序,利用Stroll公式计算了不同各向异性材料之间界面裂纹周围的应力分布的渐近解。这是发展计算各向异性不同材料界面裂纹应力强度因子的数值方法的最重要的一步。给出了各向异性板在均布拉剪载荷作用下中心界面裂纹应力强度因子的解析解。
项目成果
期刊论文数量(37)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
Toru Ikeda, Yuji Komohara and Noriyuki Miyazaki: "Criteria for Fracture and Kinkig of Mixed Mode Interface Crack"Transactions of the Japan Society of Mechanical Engineers (Series A) (in Japanese). Vol. 66. No. 644. 796-803 (2000)
Toru Ikeda、Yuji Komohara 和 Noriyuki Miyazaki:“混合模式界面裂纹的断裂和扭结的标准”日本机械工程师学会会刊(A 系列)(日语)。
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Toru Ikeda, Yuji Komohara, Atsushi Nakomura and Noriyuki Miyazaki: "Kinking out of Mixed Mode Interface Crack"Key Engineering Materials. Vols. 183-187. 73-78 (2000)
Toru Ikeda、Yuji Komohara、Atsushi Nakomura 和 Noriyuki Miyazaki:“Kinking out of Mixed Mode Interface Crack”关键工程材料。
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池田 徹, 菰原 裕二, 宮崎 則幸: "プラスチックパッケージにおける界面き裂のはく離限界"日本機械学会論文集(A編). 第66巻648号. 1533-1540 (2000)
Toru Ikeda、Yuji Kobara、Noriyuki Miyazaki:“塑料封装界面裂纹的剥离极限”,日本机械工程学会会刊(A 版),第 66 卷,第 648 期。1533-1540(2000 年)。
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池田徹 他: "混合モード界面き裂の破壊と屈曲条件"日本機械学会論文集(A編). 66・644. 796-803 (2000)
Toru Ikeda 等:“混合模式界面裂纹的断裂和弯曲条件”日本机械工程学会会刊(ed.A) 796-803(2000 年)。
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池田 徹, 菰原 裕二, 中村 敦, 宮崎 則幸: "混合モード界面き裂の破壊と屈曲条件"日本機械学会論文集(A編). 第66巻644号. 796-803 (2000)
Toru Ikeda、Yuji Kobara、Atsushi Nakamura、Noriyuki Miyazaki:“混合模式界面裂纹的断裂和弯曲条件”日本机械工程学会会刊(A 版)第 66 卷,第 644 期。796-803(2000 年)。
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{{ truncateString('IKEDA Toru', 18)}}的其他基金
Symmetries of spatial graphs by 3-manifold topology
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- 批准号:
16K05163 - 财政年份:2016
- 资助金额:
$ 1.47万 - 项目类别:
Grant-in-Aid for Scientific Research (C)
Nano-mechanical investigation of the effects of mechanical strain on semiconductor devices
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- 批准号:
23656083 - 财政年份:2011
- 资助金额:
$ 1.47万 - 项目类别:
Grant-in-Aid for Challenging Exploratory Research
Reliability Design of Conductive Adhesive Connection in Electronic Packages
电子封装中导电胶连接的可靠性设计
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14550082 - 财政年份:2002
- 资助金额:
$ 1.47万 - 项目类别:
Grant-in-Aid for Scientific Research (C)
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