Development of highly sensitive high-resolution PIXE system to chemical state analysis.

开发用于化学状态分析的高灵敏度高分辨率PIXE系统。

• 批准号: 13650054
• 负责人: HAMANAKA Hiromi
• 金额: $ 2.24万
• 依托单位: Hosei University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (C)
• 财政年份: 2001
• 资助国家: 日本
• 起止时间: 2001 至 2002
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-13650054/
• 关键词: PIXE; PSPC; Chemical state analysis; X-ray spectrometer; Wavelength dispersive; X線結晶分光; エネルギー分解能; 結晶分光; 位置センサー

We have constructed a wavelength dispersive X-ray spectrometer equipped with a charge-division position-sensitive proportional counter (PSPC) for PIXE measurement under vacuum. A laser displacement sensor was installed in the system to determine the position of a sample in a precision of ±3μm during the ion beam bombardments. The precise measurement of sample position improved the reliability of chemical state analysis. It is important in the stability of PSPC to substitute the air in PSPC with counter gas completely. Some experiments were also performed to improve the feasibility of chemical state analysis in non-vacuum. A crystal spectrometer of v. Hamos geometry composed of a cylindrically curved crystal and a single PSPC was newly constructed. Performance of the newly constructed spectrometer is considerably improved compared to that of previously developed spectrometers for high-resolution PIXE. Sensitivity of the new spectrometer is about 10 times higher than that of a spectrometer consisting of a flat crystal and a single PSPC. Furthermore, ratio of signal peak to background noise of this spectrometer measured at sulfur K 13 is about 5 times higher than that of the spectrometer which consists of a combination of a flat crystal and the multi-stacked PSPC.

我们研制了一台用于真空下质子激发X射线荧光分析的波长色散X射线谱仪。在系统中安装了激光位移传感器，用于测量离子束轰击过程中样品的位置，测量精度为±3μm。样品位置的精确测量提高了化学状态分析的可靠性。用平衡气完全替代PSPC中的空气对PSPC的稳定性有重要影响。为提高在非真空条件下进行化学状态分析的可行性，进行了一些实验。本文报道了一种由圆柱形弯曲晶体和单台PSPC组成的v. Hamos几何晶体谱仪。与以前开发的高分辨率PIXE光谱仪相比，新建造的光谱仪的性能得到了很大的改善。该谱仪的灵敏度比由平晶体和单光子晶体组成的谱仪高10倍左右。在硫K13处测得的峰背景比，比平晶体与多层PSPC组合的谱仪高5倍左右。

项目成果

H.Hamanaka, K.Hasegawa, K.Maeda: "APPLICATION OF A LASER DISPLACEMENT SENSOR TO HIGH RESOLUTION PIXE"Rep.of Rese.Cent.of Ion Beam Tech. Hosei Univ.. 20. 111-114 (2002)

H.Hamanaka、K.Hasekawa、K.Maeda：“激光位移传感器在高分辨率像素上的应用”Rep.of Rese.Cent.of Ion Beam Tech。

K.Maeda, K Hasegawa, H.Hamanaka, M.Maeda, S.Yabuki, K.Ogiwara: "RAPID CHEMICAL STATE ANALYSIS BY A HIGHLY SENSITIVE HIGH-RESOLUTION PIXE SYSTEM"Nucl.Instr. and Meth.. B190. 704-708 (2002)

K.Maeda、K Hasekawa、H.Hamanaka、M.Maeda、S.Yabuki、K.Ogiwara：“通过高灵敏度高分辨率像素系统进行快速化学状态分析”Nucl.Instr。

K.Maeda, A.Tonomura, H.Hamanaka, K.Hasegawa: "IMPROVEMENT IN THE PRECISION AND THE FACILITY OF CHEMICAL SHIFT MEASUREMENTS USING A POSITION-SENSITIVE CRYSTAL SPECTROMETER"Int.J.PIXE. 11. 35-44 (2001)

K.Maeda、A.Tonomura、H.Hamanaka、K.Hasekawa：“使用位置敏感晶体光谱仪改进化学位移测量的精度和设施”Int.J.PIXE。

浜中廣見, 前田邦子, 長谷川賢一: "結晶分光PIXEによるAlの状態分析:レーザセンサによる試料位置決めの提案"第18回PIXEシンポジウム. (2001)

Hiromi Hamanaka、Kuniko Maeda、Kenichi Hasekawa：“使用晶体光谱 PIXE 进行 Al 的状态分析：使用激光传感器进行样品定位的提案”第 18 届 PIXE 研讨会（2001 年）。

前田邦子, 長谷川賢一, 浜中廣見, 前田 勝: "大気中高分解能PIXEの高感度化"第18回PIXEシンポジウム. (2001)

Kuniko Maeda、Kenichi Hasekawa、Hiromi Hamanaka、Masaru Maeda：“提高大气中高分辨率 PIXE 的灵敏度”第 18 届 PIXE 研讨会（2001 年）。