Mechanical deformation of layered semiconductor structures

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This project aims to reveal the mechanisms of mechanical deformation in thin film layered semiconductors structures. Currently, there is little knowledge in this area despite the importance of such structures in electronic and optoelectronic devices. Layered structures are not expected to respond to mechanical stress in the same way as bulk materials, as a result of size constraints in nanoscale films, the critical importance of strain, and the possibility of disparities between the mechanical properties of the individual layers. The results of this project will dramatically enhance the understanding of the deformation responses of nanoscale structures to mechanical stress.