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Development to Determine The Components of Plane Stress Using Whole Diffraction Ring.

使用整个衍射环确定平面应力分量的开发。

基本信息

批准号：
14550088
负责人：
OHYA Shin-ichi
金额：
$ 2.18万
依托单位：
Musashi Institute of Technology
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (C)
财政年份：
2002
资助国家：
日本
起止时间：
2002 至 2004
项目状态：
已结题

项目摘要

X-ray stress measuring technique is effective nondestructive tool to measure residual stresses and applied stresses in polycrystalline materials with sufficient reliability. Most popular X-ray stress measurement method is the sin^2Ψ method by which the lattice strains at the various angles of Ψ, between the normal of a diffraction plane and normal of a specimen surface, linearly depend on sin^2Ψ. The stress in the direction of Ψ-inclination is determined from strains at the various Ψ angles using theory of elasticity. The sin^2Ψ method is widely used as laboratory technique and the field measurement. In the field measurement, there is mainly a difficult case in the measurement by the sin^2Ψ method because of constraint of space for Ψ-inclination.By the way, in former time, the cos α method using flat pinhole camera containing X-ray film has been proposed. This method is that the plane stress components, σ_x,σ_y,τ_<xy>, are determined by using the whole diffraction ring obtained at only a Ψ angle according to back-reflection of X-rays. This method has the advantage that misalignment of specimen hardly influences for measured stress and that there are a little spatial constraint in measuring stress. However, the cosa method using X-ray film has a problem that measured stresses are influenced by the determination accuracy of incident X-ray position.In this study, new principle of stress measurement using whole diffraction ring was proposed. And stress analyzer based on the new method was developed. As a result, it was clarified that this analyzer enables to measure plane stress components. And this method can sufficiently contribute to study on material science and use for field stress measurement. This investigation was presented in The 7^<th> International Conference of Residual Stresses on June in 2004,the high evaluation was obtained for degree of useful of this method.

X射线应力测量技术是测量多晶材料残余应力和外加应力的有效无损工具，具有足够的可靠性。最常用的X射线应力测量方法是sin^2 θ法，通过该方法，在衍射平面法线和样品表面法线之间的不同θ角处的晶格应变与sin^2 θ成线性关系。利用弹性理论，由不同直角处的应变确定了在直角倾斜方向上的应力。正弦曲线法被广泛地用作实验室技术和现场测量。在现场测量中，由于X射线倾斜的空间限制，用sin α法测量主要是一个困难的情况，而以前曾有人提出过用含X射线胶片的平针孔相机进行cos α法测量。这种方法是利用<xy>X射线背反射在一个夹角处得到的整个衍射环来确定平面应力分量σ_x、σ_y、τ_。该方法的优点是试件的错位对应力测量的影响小，应力测量的空间约束小。针对利用X射线胶片的cosa法存在的X射线入射位置确定精度影响应力测量的问题，提出了利用整个衍射环测量应力的新原理。并研制了基于该方法的应力分析仪。结果表明，该分析仪能够测量平面应力分量。该方法可为材料科学研究和现场应力测量提供充分的依据。2004年6月在第七届<th>国际残余应力会议上发表了该方法的研究成果，对该方法的实用程度给予了很高的评价。

项目成果

期刊论文数量（9）

专著数量（0）

科研奖励数量（0）

会议论文数量（0）

专利数量（0）

X-Ray Stress Measurement Using Whole Back Diffraction Ring

DOI：
10.4028/www.scientific.net/msf.490-491.137
发表时间：
2005-04
期刊：
Materials Science Forum
影响因子：
0
作者：
S. Ohya;K. Akita;Yuichi Shitaba;Mitsutoshi Yoshikawa
通讯作者：
S. Ohya;K. Akita;Yuichi Shitaba;Mitsutoshi Yoshikawa

背面反射回折X線像を用いた応力測定装置の開発

开发利用背反射衍射X射线图像的应力测量装置

DOI：
发表时间：
2004
期刊：
日本非破壊検査協会第35回応力・ひずみ測定と強度評価シンポジウム講演論文集
影响因子：
0
作者：
大谷眞一;秋田貢一;萩原芳彦;下羽悠一;吉川光俊
通讯作者：
吉川光俊

大谷眞一, 秋田貢一, 萩原芳彦, 下羽悠一, 吉川光俊: "背面反射回折X線像を用いた応力測定装置の開発"第35回応力・ひずみ測定と強度評価シンポジウム講演論文集. 133-138 (2003)

Shinichi Otani、Koichi Akita、Yoshihiko Hagiwara、Yuichi Shimoba、Mitsutoshi Yoshikawa：“使用背反射衍射 X 射线图像的应力测量装置的开发”第 35 届应力/应变测量和强度评估研讨会论文集 133-138（2003 年）。