Trace element analysis, focused on d-transition elements, of oral mucosa of patents with oral lichen planus by PIXE method

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1. We made a comparative study of the elements in oral mucosae of 29 patients with oral lichen planus (OLP group) and of 100 healthy persons (control group) by Particle Induced X-Ray Emission (PIXE) method.2. We detected 17 trace elements and 11 contaminated elements in the oral mucosae of both groups.3. We found by the PIXE method that the mean values of Zn and Pd, which are d-transitional elements and considered to cause allergic reaction, were significantly higher values in the oral mucosae of the OLP patients than in those of the healthy persons.4. Elements in normal oral mucosa, saliva and serum were determined by Particle Induced X-ray Emission (PIXE) method. The samples were taken from 4 healthy persons (3 male and 1 female) ages 26 to 77 years with a mean age of 49.0 years old. Twenty-seven elements were detected in normal oral mucosa. Thirty-one elements were detected in saliva. Thirty elements were detected in serum. Twelve elements (Na, Mg, P S, Cl K, Ca, Fe, Cu, Zn, Br, Al) were in all samples. In the mean value of Na, Mg, P S, Cl K, Ca, Mn, Fe, Co, Cu, Zn, Se, Al, Ti and Pb, oral mucosa showed higher value than the saliva and serum. In the mean value of Rb, oral mucosa showed higher value than the saliva. Ten contaminated elements were detected and especially Al were in all samples.