Trace element analysis of the tissue from the oral lichen planus patients by the PIXE method

为探讨口腔扁平苔藓（OLP）的病因，我们用粒子激发X射线荧光分析（PIXE）方法对31例OLP患者和100例健康人口腔粘膜中的微量元素进行了比较研究。结果表明：共检出17种微量元素和11种污染元素。对于30岁以上的女性，OLP组的Si、Fe、Zn、Al和Sr值显著高于对照组。其他必需元素和污染元素的平均值在两组之间没有显著差异，尽管OLP组中有较高值的趋势。用PIXE方法发现，OLP患者口腔粘膜中d-过渡元素Zn、Fe、Pd的含量高于正常人。

We made a comparative study of trace elements in the oral mucosa of 31 patients with oral lichen planus(OLP) and of 100 healthy persons by the Particle Induced X-ray Emission(PIXE) method in order to clarify the causes of OLP. The results were as follows : Seventeen trace elements and 11 contaminating elements were detected. As for the females over 30 years old, the OLP group showed significantly higher values of Si, Fe, Zn, Al and Sr than the control group. The mean values of the other essential and contaminating elements did not differ significantly between the groups, although there was a trend toward higher values in the OLP group. We found by the PIXE method that Zn, Fe and Pd, which are d-transitional elements, showed higher values in the oral mucosa of the OLP patients than in those of the healthy persons.