Ultra-high resolution SPECT with a semiconductor detector and a diverging collimator

具有半导体探测器和发散准直器的超高分辨率 SPECT

• 批准号: 18390337
• 负责人: OGAWA Koichi
• 金额: $ 10.59万
• 依托单位: Hosei University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2006
• 资助国家: 日本
• 起止时间: 2006 至 2007
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-18390337/
• 关键词: semiconductor detector; single photon emission CT; diverging collimator; ultra-high resolution imaging; Monte Carlo simulation; gamma ray

The development of semiconductor detectors such as CdTe, which works at room temperature, has facilitated the development of a new SPECT system. These semiconductor detectors have a high energy resolution. Moreover, they are used as pixellated detectors, and so the intrinsic resolution can be equal to the size of the pixel used for measurement. The detector pixel is as small as 0.5mm, and so the spatial resolution of a reconstructed SPECT image can be less than 3mm FWHM. To clarify the feasibility of an ultra-high resolution SPECT system, we conducted some simulations and evaluated the quality of images. In these simulations we used a diverging collimator to enlarge the field of view of the detector and compared the quality of the reconstructed images of a pixellated SPECT system with a conventional SPECT system with a scintillation detector and parallel-hole collimator under the same sensitivity and reduced sensitivity. The results showed that the improvement of the spatial resolution in the pixellated semiconductor detector yielded high quality images even under the low sensitivity condition due to the small size of the pixels. With the above results we built a prototype semiconductor SPECT system with a diverging collimator. In this system we made the diverging collimator by using several hundreds of thin tungsten plates. With this proposed ultra-high resolution system we established the reconstruction of rod phantoms(hot rod phantom and cold rod phantom) with the spatial resolution of 1.0mm for the hot rods and 1.6mm for the cold rods. The obtained results with the simulation and experiment showed that the ultra-high resolution SPECT system was available with the semiconductor detector and a parallel-hole collimator or a diverging collimator with holes of a small size.

在室温下工作的半导体检测器（例如CDTE）的开发促进了新的SPECT系统的发展。这些半导体探测器具有高能量分辨率。此外，它们被用作像素的检测器，因此内在分辨率可以等于用于测量的像素的大小。检测器像素小至0.5mm，因此重建的SPECT图像的空间分辨率可能小于3mm FWHM。为了阐明超高分辨率SPECT系统的可行性，我们进行了一些模拟并评估了图像的质量。在这些模拟中，我们使用分解的准直仪扩大了检测器的视野，并将像素SPECT系统的重建图像的质量与具有闪烁检测器和平行孔直接仪在相同灵敏度和敏感性下的常规SPECT系统中进行了比较。结果表明，即使在像素的尺寸较小，像素化半导体检测器中空间分辨率的改善也产生了高质量的图像。通过上述结果，我们构建了一个原型半导体SPECT系统，具有不同的准直仪。在这个系统中，我们使用数百个薄钨板制造了分化的准仪。使用该提出的超高分辨率系统，我们建立了杆幻象（热杆幻像和冷杆幻象）的重建，热杆的空间分辨率为1.0mm，冷杆的空间分辨率为1.6mm。通过仿真和实验获得的结果表明，半导体检测器和平行孔准直仪或带有小尺寸孔的发散准直仪的超高分辨率SPECT系统。

项目成果

Ultra-high Resolution SPECT with CdTe Detectors

• DOI: 10.1007/978-3-540-89208-3_199
• 发表时间: 2009
• 作者: Naoka Ohmura;K. Ogawa

超高分解能SPECTに関するモンテカルロシミュレーション

超高分辨率 SPECT 的蒙特卡罗模拟

• 发表时间: 2006
• 期刊: 医学物理 26(3)
• 作者: Nalu;Navarro-Alvarez;Koichi Ogawa;村石雅明
• 通讯作者: 村石雅明

Simulation Study on an Ultra-High Resolution SPECT with CdTe Detectors

CdTe 探测器超高分辨率 SPECT 仿真研究

• 发表时间: 2006
• 期刊: Conference record on IEEE Nuclear Science Symposium and Medical Imaging Coference
• 作者: Nalu;Navarro-Alvarez;Koichi Ogawa
• 通讯作者: Koichi Ogawa

半導体検出器を用いたSPECT

使用半导体探测器的 SPECT

• 发表时间: 2006
• 作者: S. Yamamoto;K. Matumoto and M. Senda;S. Yamamoto;小宮山 英明
• 通讯作者: 小宮山 英明

ピクセル型検出器を用いた超高分解能イメージング

使用像素型探测器的超高分辨率成像

• 发表时间: 2006
• 期刊: 核医学 43(3)
• 作者: Nalu;Navarro-Alvarez;Koichi Ogawa;村石雅明;尾川浩一
• 通讯作者: 尾川浩一