Development of Prediction Method of Thermal Flux Loss in Permanent Magnet Used in Electrical and Electronic Devices

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We developed a technique to predict flux loss of a magnet used in electrical and electronic devices with a complicated magnetization pattern. The developed method uses the finite element method and consists of four steps. At first, the distribution of magnetization under magnetizing field is analyzed (Step 1), and a demagnetization curve of each element is deduced from the results of the first step (Step 2). Subsequently, the distributions of magnetization at room and elevated temperatures are analyzed by using demagnetization curves determined in Step 2 (Step 3). In Step 4, the distribution of flux loss due to exposure at the elevated temperature is predicted based on a physical model by using the results in Step 3. We applied this technique to a Nd-Fe-B ring shaped magnet with 10 poles, and confirmed that the predicted flux loss values agreed with those obtained experimentally.