Chemical analysis of nuclear materials by synchrotron based X-ray imaging technique

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Synchrotron radiation based imaging XAFS technique was developed to analyze two-dimensional distribution of selected element and their chemical state in matrix mixtures. X-ray CCD camera was used as the X-ray intensity detector in the measurement. Position sensitivity was added to the conventional XAFS technique by obtaining gray-scale values from each CCD picture. While aiming at technical progress by analyzing some standard samples, practical use was tried to analysis of nuclear materials.