Study on phase transition of functional materials by X-ray fluorescence holography

点击翻译按钮获取中文摘要

We have developed X-ray fluorescence holography apparatus with a cryostat system, which can cool samples down to 5 K. And, holograms of Ti50Ni50-xFexsystems were measured at temperatures below and above the phase transitiontemperatures. Moreover, we applied the X-ray fluorescence holography to the evaluations of local lattice distortions around Ga and in In0.995Ga0.005Sb. Resultingly, it was founded that neighboring atoms around dopants are displaced along the angular direction rather than the radial direction.