Nano-scale displacement measurement by fusing optical millimeter wave technology and two-photon absorption phenomenon

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Nano-precision measurement is required for measuring sample thickness and surface roughness in the field of nano-material production process, bio technology and otheres, where the measurement range is usually limited to within several μm. In this study, we proposed a novel measurement method that uses a light called optical millimeter wave and a nonlinear phenomenon known as two-photon absorption process, and then experimentally confirmed the possibility of nano-precision measurement. Furthermore, we developed the same method into a system for measuring the reflection point of an optical fiber at several 10 km away within an error of several meters.