Fabrication of controlled nanodefects for flux pinning studies of YBCO thin films

点击翻译按钮获取中文摘要

This study explores a top-to-bottom, straightforward method for introducing controlled nanoscale defects into already grown superconducting YBa_2Cu_3O_<7-δ>(YBCO) thin films. Nanoporous anodic aluminum oxide free-standing membranes having columnar pores～ 100 nm in diameter were utilized as etching masks in conjunction with conventional argon ion milling to introduce the nanodefects in the YBCO films. Significant enhancements in the critical current density and flux pinning properties of the YBCO thin films were achieved through the introduction of the nanodefects.