A Systematic Test Generation Approach to Achieving VariousTest Qualities for LSIs Based on Mathematical Programming

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This work focused attention on mathematical programming (especially, integer programming) as a test generation framework that can flexibly generate various types of tests required for large-scale integrated circuits (LSIs). Several methods have been devised to formulate integer programming models for different test generation problems and to heuristically solve them. This framework allows us to solve these problems with a powerful off-the-shelf solver for integer programming, without developing any newtechniques dedicated to them. The results can lead to enhancing the reliability of LSIs at low cost.