Development of Methods and Strategies for the Measurement, Interpretation and Analysis of Diffuse X-ray Scattering from Disordered Materials.

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This application seeks to exploit our established lead in the measurement of diffuse scattering from disordered materials and its analysis using large-scale computer simulations. Many industrially important materials such as ceramics, superconductors, catalysts, electro-optical materials and minerals owe their special properties to the disorder in their structure. This disorder causes diffuse X-ray scattering which can be probed using synchrotron X-rays and powerful computers to reveal details about the material's nanoscale structure. The new methodology being developed will enhance our detailed understanding of the relationships between structure and properties in materials and help promote the design of new materials.