Development of methods to identify atoms bonded to a specific surface atom and to analyze the adsorption state using inter-atomic Auger processes

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We have developed an electron-electron-ion coincidence spectrometer with a high detection efficiency to identify atoms bonded to a specific surface atom and to analyze the adsorption state using interatomic Auger processes. Although the coincidence counting rate was improved in comparison with that of a previous analyzer, we could not detect interatomic Auger electrons. Using the coincidence analyzer we have studied decay processes of a Si-2s core hole on a Si(111) surface.