Nanoparticle Imaging with Polarization-interferometric Nonlinear Confocal Microscope

使用偏振干涉非线性共焦显微镜进行纳米颗粒成像

• 批准号: 23656183
• 负责人: EGAMI Chikara
• 金额: $ 2.41万
• 依托单位: Shizuoka University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Challenging Exploratory Research
• 财政年份: 2011
• 资助国家: 日本
• 起止时间: 2011 至 2013
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-23656183/
• 关键词: 微粒子; 顕微鏡

In this work, incorporating a Michelson-type polarization-vector interferometer into a nonlinear confocal microscope, we propose novel microscopy in order to observe a single nanoparticle inhomogeneously doped with chromophores. Here, in the first step, we set the polarization-interferometric confocal signal minimum while scanning homogeneous matrix outside of inhomogeneous areas in the nanoparticle. As a next step, the microscope measures the inhomogeneous areas. As a result, the inhomogeneous areas with third-order susceptibility shines out against the dark background with high contrast. The microscope has observed an inspection image inside the single nanoparticle. Three-dimensional image obtained from the confocal microscope proposed is comprised of a series of optical sections along the z axis. The microscope can resolve detail in the nanoparticle with susceptibility distribution.

在这项工作中，我们将迈克尔逊型偏振矢量干涉仪合并到非线性共焦显微镜中，提出了一种新颖的显微镜来观察不均匀掺杂发色团的单个纳米颗粒。在这里，第一步，我们在扫描纳米颗粒不均匀区域外部的均匀矩阵时设置偏振干涉共焦信号最小值。下一步，显微镜测量不均匀区域。因此，具有三阶磁化率的不均匀区域在高对比度的黑暗背景下闪闪发光。显微镜观察到单个纳米颗粒内部的检查图像。从所提出的共焦显微镜获得的三维图像由一系列沿 z 轴的光学截面组成。显微镜可以通过磁化率分布解析纳米粒子的细节。

项目成果

Cross section measurement of nanoparticle with polarizationinterferometric confocal microscope

用偏振干涉共焦显微镜测量纳米粒子的横截面

• 发表时间: 2012
• 期刊: Proc. 20th Aust. Inst. Phys. Cong
• 作者: Norio Tanada;Takeshi Sakurai;Hidefumi Mitsuno;Douglas J Bakkum;Ryohei Kanzaki;Hirokazu Takahashi;C. Egami
• 通讯作者: C. Egami

3D Nanoparticle Analysis with Polarizationinterferometric Confocal Microscope

使用偏振干涉共焦显微镜进行 3D 纳米颗粒分析

• 发表时间: 2013
• 作者: Norio Tanada;Takeshi Sakurai;Hidefumi Mitsuno;Douglous Bakkum;Ryohei Kanzaki;Hirokazu Takahashi;池上崇;廣瀬優紀;C. Egami and K. Fujita
• 通讯作者: C. Egami and K. Fujita

Cross Section Measurement of Nanoparticle with Polarization-interferometric Confocal Microscope

用偏振干涉共焦显微镜测量纳米粒子的横截面

• 发表时间: 2012
• 期刊: Proc 20th Aust. Inst. Phys. Cong.
• 作者: Tadakuma;Kenjiro;Ogata;Hirohiko;Tadakuma;Riichiro;Berengueres;Jose;Takashi Ikegami;Chikara Egami
• 通讯作者: Chikara Egami

Internal surface measurement of nanoparticle with polarization-interferometric nonlinear confocal microscope

用偏振干涉非线性共焦显微镜测量纳米粒子的内表面

• 发表时间: 2011
• 期刊: Int. J. Chem. and Env. Eng
• 作者: C. Egami;K. Kuwahara
• 通讯作者: K. Kuwahara

偏光干渉非線形共焦点顕微鏡によるナノ微粒子の三次元影像

使用偏振干涉非线性共焦显微镜观察纳米粒子的三维图像

• 发表时间: 2013
• 作者: 藤田 倖平;江上 力
• 通讯作者: 江上 力