Nanoparticle Imaging with Polarization-interferometric Nonlinear Confocal Microscope

在这项工作中，我们将迈克尔逊型偏振矢量干涉仪引入到非线性共聚焦显微镜中，提出了一种新的显微镜来观察单个非均匀掺杂生色团的纳米粒子。在这里，在第一步中，当扫描纳米颗粒中不均匀区域之外的均匀矩阵时，我们将偏振干涉共焦信号设置为最小。下一步，显微镜测量不均匀的区域。结果，具有三阶磁化率的不均匀区域在高对比度的暗背景下闪耀着光芒。显微镜观察到了单个纳米颗粒内部的检查图像。从所提出的共焦显微镜获得的三维图像是由沿z轴的一系列光学切片组成的。该显微镜可以分辨出磁化率分布在纳米颗粒中的细节。

In this work, incorporating a Michelson-type polarization-vector interferometer into a nonlinear confocal microscope, we propose novel microscopy in order to observe a single nanoparticle inhomogeneously doped with chromophores. Here, in the first step, we set the polarization-interferometric confocal signal minimum while scanning homogeneous matrix outside of inhomogeneous areas in the nanoparticle. As a next step, the microscope measures the inhomogeneous areas. As a result, the inhomogeneous areas with third-order susceptibility shines out against the dark background with high contrast. The microscope has observed an inspection image inside the single nanoparticle. Three-dimensional image obtained from the confocal microscope proposed is comprised of a series of optical sections along the z axis. The microscope can resolve detail in the nanoparticle with susceptibility distribution.