Ｐｄ系金属ガラスの相分離組織に関する微視的観察

钯基金属玻璃相分离结构的显微观察

• 批准号: 16F16771
• 负责人: 渡辺 健太郎
• 金额: $ 1.41万
• 依托单位: Tohoku University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for JSPS Fellows
• 财政年份: 2016
• 资助国家: 日本
• 起止时间: 2016-11-07 至 2019-03-31
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-16F16771/
• 关键词: Metallic Glass; 金属ガラス; 構造ゆらぎ; 電子回折; 電子顕微鏡; ナノ構造

The structural order of metallic glasses beyond SRO (short-range order) has been intensely discussed before. Although X-ray and neutron diffraction profiles provide strong indication of the existence of MRO (medium-range order) in metallic glasses, the average structure information derived from broad diffraction peaks cannot provide consistent structure information on true atomic arrangements in real space. Classical MD and ab initio MD simulations have been proved to be effective in determining SRO in metallic glasses, however, the MD simulation takes too long time to reveal formation of MRO.We have successfully developed scanning ABED (angstrom beam electron diffraction), which is probably the only technique that is capable of experimentally elucidating the atomic arrangements in metallic glasses beyond SRO by providing non-averaged two dimensional diffraction patterns with a high spatial resolution of 0.2 nm. This scanning ABED unravels MRO of metallic glasses and constructed plausible MRO models based on the experimental data.

以外的SRO（短距离顺序）之外的金属玻璃的结构顺序已经进行了深入讨论。尽管X射线和中子衍射曲线可很好地表明金属玻璃中MRO（中等顺序）的存在，但从宽衍射峰得出的平均结构信息不能提供有关真实空间中真实原子安排的一致结构信息。事实证明，经典的MD和AB Initi算MD模拟在确定金属玻璃中的SRO方面是有效的，但是，MD模拟需要太长时间来揭示MRO的形成。我们已经成功地开发了扫描ABED（Angstrom Beam Electon diffaction），这可能是唯一能够通过实验性地进行二线dimenter dim dim dim dim dim a inta arto dimenter glige a atroic glaber-aptro glaber的技术。高空间分辨率为0.2 nm。基于实验数据，这种扫描扫描的金属眼镜和合理的MRO模型将MRO分发。

项目成果

ジョンズホプキンス大学(米国)

约翰·霍普金斯大学（美国）

Deformation behaviour of 18R long-period stacking ordered structure in an Mg-Zn-Y alloy under shock loading

• DOI: 10.1016/j.intermet.2018.08.007
• 发表时间: 2018-11
• 期刊: Intermetallics
• 影响因子: 4.4
• 作者: Fan Zhang;Y. Ren;S. Ning;Yuan Tian;Weiwei Hu;C. Tan;T. Fujita;A. Hirata;Mingwei Chen