Growth Kinetics of Iron Silicides in the Fe/Si Bulk Reaction Diffusion Couple and Thermo-Electric Property of FeSi_2 Formed by This Method.
Growth Kinetics of Iron Silicides in the Fe/Si Bulk Reaction Diffusion Couple and Thermo-Electric Property of FeSi_2 Formed by This Method.
批准号:
09650722
负责人:
SHIMOZAKI Toshitada
金额:
$1.79万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
1997
资助国家:
日本
项目状态:
已结题
起止时间:
1997 至 1998
中文摘要
采用4N-Fe、2N-Fe三种铁片与间质自由钢(IF-steel)和<100>取向硅片组成的体扩散对,研究了Fe/Si二元体系中的反应扩散。在这些扩散偶中形成的扩散层的生长速度彼此有很大差异。if -钢/Si扩散偶层的形成速度比4N-Fe/Si扩散偶层的形成速度快10倍以上。通过对比这些铁片中杂质的影响,讨论了不同生长速率的原因。对这种生长行为的一种可能的解释是,虽然没有证据表明4N-Fe中的氧是减缓硅化铁生长速度的候选因素,但4N-Fe中的Ti通过清除效应消除了氧的影响,因此if-steel/Si偶体的生长速度比4N-Fe/Si偶体快。
英文摘要
Reaction diffusion in Fe/Si binary system has been studied by using bulk diffusion couples being consisted of 3 kinds of iron sheets, i.e., 4N-Fe, 2N-Fe and interstitial free steel(IF-steel) and a <100> oriented silicon wafer. The growth rate of diffusion layers formed in these diffusion couples considerably differ from each other. The rate of the layers formed in the IF-steel/Si couple is more than ten times faster than that in the 4N-Fe/Si diffusion couple.The reason for the different growth rate was discussed by correlating the effect of impurity contained in these Fe sheets. A possible explanation of this growth behavior has been proposed as follows that oxygen in 4N-Fe is considered as a candidate which slows down the growth rate of iron silicides, although the evidence is not found, and Ti in 4N-Fe remove the effect of oxygen by scavenging effect so that the growth in if-steel/Si couple can be faster than 4N-Fe/Si couples.
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Okino: "Self-interstitial in Silicon" Jpn.J.Appl.Phys.Vol.36 (part 1. No.11). 6591-6594 (1997)
Okino:“硅中的自间隙”Jpn.J.Appl.Phys.Vol.36(第 1 部分,第 11 期)。
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大西正己: "2元系反応拡散のける異相界面移動に関する界面反応と局所平衡" 日本金属学会誌. 62・6. 505-509 (1998)
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T.Shimozaki: "Effect of Diffusion Barrier and Impurity in Ti on the Growth" Defect and Diffusion Forum. 143-147. 591-596 (1997)
T.Shimozaki:“扩散势垒和钛中杂质对生长的影响”缺陷和扩散论坛。
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下崎敏唯: "光照射によるGaAlAs系発光ダイオード表面での酸素の浸透" 日本金属学会誌. 61・11. 1268-1269 (1997)
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T.Shimozaki: "Effect of Diffusion Barrier and Impurities in Titaninm on the Growth of TiAl3 Layer" Defect and Diffusion Forum.143-147. 591-596 (1997)
T.Shimozaki:“Titaninm 中的扩散势垒和杂质对 TiAl3 层生长的影响”缺陷和扩散论坛。143-147。
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共 6 条
Examination of techniques for synthesizing highly efficiency thermoelectric material NaCo2O4.
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批准号:14550686
-
项目类别:Grant-in-Aid for Scientific Research (C)
-
资助金额:$1.86万
-
财政年份:2002
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负责人:SHIMOZAKI Toshitada
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依托单位:
Preparation of Thermoelectric Material by Reactive Diffusion Method
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批准号:11695053
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项目类别:Grant-in-Aid for Scientific Research (B).
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资助金额:$1.6万
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财政年份:1999
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负责人:SHIMOZAKI Toshitada
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依托单位:
Fundamental research on growth kinetickd of silicides due to solid reaction between metal and silicon
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批准号:04650604
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项目类别:Grant-in-Aid for General Scientific Research (C)
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资助金额:$1.34万
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财政年份:1992
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负责人:SHIMOZAKI Toshitada
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依托单位: