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Functional evaluation of surface waviness of contact recording magnetic disk and analytical estimation of head flying locus

接触式记录磁盘表面波纹度的功能评价及磁头飞行轨迹的分析估计

基本信息

批准号：
09650162
负责人：
YANAGI Kazuhisa
金额：
$ 2.18万
依托单位：
NAGAOKA UNIVERSITY OF TECHNOLOGY
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (C)
财政年份：
1997
资助国家：
日本
起止时间：
1997 至 1999
项目状态：
已结题

项目摘要

First of all in this study, a distinguished stylus instrument with extremely light load was developed to measure envelope curves along the circumferential tracks of disk surface. Pointed out were the higher measurement accuracy (±1nm/15mm) and the wider surface wavelength band than conventional optical interferometers on the market. An elaborate geometrical regression technique was developed to obtain the proper amplitude data with high S/N ratio.Considering the head slider size and its follow-up motion to disk surface, the measuring conditions (sampling interval, evaluation length) for assessing the micro-waviness of disk surface were established and a conventional filtering method was adopted to divide the original envelope curve into several wavelength bands. A fairy good agreement was obtained between the processed profiles with the developed instrument and the commercial optical interferometer, OptiFlat. In this stage, some geo-statistical parameters such as mean wavelength, arithmetic mean amplitude and Motif parameters were introduced to evaluate the micro-waviness of disk surfaces.Additionally, the head readout signal was measured and analyzed to know the relationship between the disk surface profile and the head flying height in operation. The micro-waviness component was closely related to the electro-magnetic conversion characteristics at the head/disk interface. It can be concluded that the disk micro-waviness has a great influence on the physical head-disk separation or the information storage density of HDD.

本研究首先研制出一种具有极轻负载的探针式磁盘表面包络线测量仪，用于测量磁盘表面沿着圆周轨迹的包络线。指出其测量精度（± 1 nm/15 mm）和表面波长带宽比市场上常规的光学干涉仪更高。为了获得高信噪比的振幅数据，提出了一种几何回归方法，并考虑磁头滑块尺寸及其随动运动，确定了评定磁盘表面微波纹度的测量条件（采样间隔、评价长度），采用传统的滤波方法将原始包络曲线划分为若干波段。一个漂亮的好协议之间获得的处理轮廓与开发的仪器和商业光学干涉仪，OptiFlat。该阶段引入平均波长、算术平均振幅和Motif参数等地统计参数来评价磁盘表面的微波纹度，并对磁头读出信号进行测量和分析，以了解磁盘表面轮廓与磁头飞行高度之间的关系。微波纹度分量与磁头/磁盘界面的电磁转换特性密切相关。由此可见，磁盘微波纹度对硬盘的物理磁盘间距或信息存储密度有很大的影响。