课题基金 / 基金详情

Integrated Plasma Source Focused Ion Beam with Scanning Electron Microscope

Integrated Plasma Source Focused Ion Beam with Scanning Electron Microscope
集成等离子源聚焦离子束与扫描电子显微镜
批准号:
EP/P001521/1
负责人:
John F Watts
金额:
$100.55万
依托单位:
依托单位国家:
英国
项目类别:
Research Grant
财政年份:
2016
资助国家:
英国
项目状态:
已结题
起止时间:
2016 至 --

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中文摘要
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英文摘要
This proposal seeks to establish a state-of-the-art plasma FIB at Surrey - only the second such instrument in the UK. The system will enable the removal of material in a controlled manner at the nanometre scale. This will enable the manufacture of nanostructures for a wide range of uses, from quantum devices to microscopic mechanical test pieces. The PFIB is equipped with scanning electron microscopy so that as material is removed in a controlled manner so a three dimensional image of the eroded area can be built up. This is tomography on the microscopic scale and enables one to image sub-surface features such as inclusions in a metal alloy, interpenetration of layers in a microelectronics device or corrosion around a second phase particle in a metal. Nanomachining is the other activity that a PFIB will perform well with samples of well defined geometry and/or thickness being produced with lengths varying from tens of nanometres (thickness of an electron transparent specimen) through to just under a millimetere. Once manufactured such specimens can be examined by transmission electron microscopy or a surface analysis technique such as secondary ion mass spectrometry. Thus this equipment bid will provide a new capability with far reaching impact across several themes and many sub-themes of the EPSRC portfolio significantly enhancing existing research both in Surrey and in collaborators across the UK as well as opening up new research possibilities. There are few single instruments currently available that can be applied to so many areas of scientific and engineering research. Materials research, one of the eight great technologies and a current government priority, is by far the most obvious benefactor but the manufacturing capability of the instrument will be applied to other nationally important areas such as experimental physics and metrology. This instrument will be very significant, its versatility and high efficiency has the potential to accelerate impact across many of these themes maintaining the United Kingdom's role as a leading science nation.
期刊论文(10)
专著(0)
科研奖励(0)
会议论文
DOI: 10.1103/physrevmaterials.5.124603
发表时间: 2021-12
期刊: Physical Review Materials
影响因子: 3.4
作者: [M. Masteghin;Vivian S. Tong;E. Schneider;Cameron C. L. Underwood;T. Peach;B. Murdin;R. Webb;S. Clowes;D. Cox]
通讯作者: M. Masteghin;Vivian S. Tong;E. Schneider;Cameron C. L. Underwood;T. Peach;B. Murdin;R. Webb;S. Clowes;D. Cox
Uncertainties in focused ion beam characterisation
聚焦离子束表征的不确定性
DOI: --
发表时间: 2020
期刊:
影响因子: --
作者: [Helen Jones]
通讯作者: Helen Jones
DOI: 10.1007/s11666-018-0721-3
发表时间: 2018-05
期刊: Journal of Thermal Spray Technology
影响因子: 3.1
作者: [Vasileios Katranidis;S. Gu;D. Cox;M. Whiting;S. Kamnis]
通讯作者: Vasileios Katranidis;S. Gu;D. Cox;M. Whiting;S. Kamnis
DOI: 10.1016/j.nimb.2019.09.013
发表时间: 2019-12-15
期刊: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
影响因子: 1.3
作者: [England, Jonathan, Cox, David, Perez-Fadon, Andres]
通讯作者: Perez-Fadon, Andres
9
    国内基金
    海外基金
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    • 批准号:
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    • 项目类别:
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    • 资助金额:
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    • 依托单位:
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    • 项目类别:
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    • 资助金额:
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    • 批准年份:
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    • 负责人:
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    • 依托单位: