High Resolution Ion Beam Analysis Facility

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The Surrey Ion Beam Centre has a long history (~40 years) of employing MeV Ion Beam Analysis techniques to aid UK academia and industry in understanding and developing materials in a number of diverse areas from cultural heritage and biomedical applications to electronic and photonic materials and steels and ceramics. In the past few years new detectors have become available which substantially increase the resolution of these classic techniques (Rutherford Back Scattering, Particle Induced X-ray Emission and Elastic Recoil Detection) which not only increase the selectivity, sensitivity and specificity of the techniques but also have the potential to add new features that will allow the small chemical shifts in the X-ray signals which can identify the bonding states of elements at depths of a few microns below a surface and in full ambient conditions. The ion beams used are such low intensity that for all but the most sensitive of materials will remain unaffected by the probing beam.The new facilities requested will greatly enhance the current UK capability.