New Developments in ToF-SIMS Surface Mass Spectrometry with ATR-IR Spectroscopy

结合 ATR-IR 光谱的 ToF-SIMS 表面质谱新进展

• 批准号: EP/C009339/1
• 负责人: Roger Webb
• 金额: $ 28.95万
• 依托单位: University of Surrey
• 依托单位国家: 英国
• 项目类别: Research Grant
• 财政年份: 2006
• 资助国家: 英国
• 起止时间: 2006 至 无数据
• 项目状态: 已结题
• 来源: https://gtr.ukri.org/projects?ref=EP%2FC009339%2F1
• 关键词: New; Developments; ToF; SIMS; Surface

A programme of a research is proposed to advance the capability of the technique - Time of Flight Secondary Ion Mass Spectrometry - ToF-SIMS. which, by bombarding the surface with moderate energy particles, analyses the surface chemistry of materials by removing and analysing molecular and atomic fragments. The research will take two directions. First we will capitalise on our exciting advances using bucky-ball (C60) and metal cluster beams to bombard the surface. These cluster beams remove molecules rather gently (ensuring that they are much less damaged in the removal process than under atomic beam bombardment), but in large quantities, enhancing sensitivity and analytical efficiency. Our research will seek to understand how these beams remove molecules from the surface, so that we can tailor their use to the samples to be analysed. This fundamental research will be augmented by some adventurous instrumental developments in collaboration with a small high technology UK company - Ionoptika Ltd. First, a totally new instrument uniquely combining ToF-SIMS and the complementary infra-red spectroscopy ATR-IR technique will be developed. Combining these two techniques in this new instrument will enable for the first time the surface chemistry and the sub-surface chemistry of complex biological, organic and inorganic materials to be studied at the same time. This is important because of the strong link between the surface chemistry of materials and their sub-surface or bulk chemistry. Second, we will incorporate tandem mass spectrometry into our ToF-SIMS. This facility enables the large complex molecules found in many materials to be selected and broken into smaller easily analysed fragments permiting accurate analysis of these molecules. Finally we will develop new ways of producing cluster ion beams that improves the focussing capability of the beams to enable analysis at high spatial resolution, so that the spatial chemistry of heterogeneous materials, eg biological tissue, cells, catlaysts etc can be characterised with high sensitivity.

提出了一项研究方案，以提高飞行时间二次离子质谱技术的能力。它通过用中等能量粒子轰击表面，通过去除和分析分子和原子碎片来分析材料的表面化学。这项研究将采取两个方向。首先，我们将利用我们令人兴奋的进步，使用巴基球（C60）和金属簇束轰击表面。这些团簇束去除分子相当温和（确保它们在去除过程中受到的损害比原子束轰击少得多），但数量很大，提高了灵敏度和分析效率。我们的研究将试图了解这些光束如何从表面去除分子，以便我们可以根据待分析的样品量身定制它们的用途。这项基础研究将得到加强，一些冒险的仪器开发与一个小的高科技英国公司- Ionoptika有限公司合作，首先，一个全新的仪器，独特的结合ToF-SIMS和互补的红外光谱ATR-IR技术将被开发。在这种新仪器中结合这两种技术将首次能够同时研究复杂生物，有机和无机材料的表面化学和亚表面化学。这一点很重要，因为材料的表面化学与其次表面或本体化学之间存在密切联系。其次，我们将把串联质谱纳入我们的ToF-SIMS。该设备能够选择在许多材料中发现的大的复杂分子，并将其分解成更小的易于分析的片段，从而对这些分子进行准确分析。最后，我们将开发产生团簇离子束的新方法，提高束的聚焦能力，以实现高空间分辨率的分析，从而可以以高灵敏度表征异质材料的空间化学，例如生物组织，细胞，催化剂等。

项目成果

The effect of the H:C ratio on the sputtering of molecular solids by fullerenes

H:C比对富勒烯分子固体溅射的影响

• DOI: 10.1002/sia.3421
• 发表时间: 2011
• 期刊: Surface and Interface Analysis
• 影响因子: 1.7
• 作者: Webb R

A molecular dynamics study of a 5 keV C 60 fullerene impact on a two-component organic molecular sample

5 keV C 60 富勒烯对双组分有机分子样品影响的分子动力学研究

• DOI: 10.1002/sia.3527
• 发表时间: 2011
• 期刊: Surface and Interface Analysis
• 影响因子: 1.7
• 作者: Ponomarev M

Modeling the interaction of keV clusters with molecular solids

模拟 keV 簇与分子固体的相互作用

• DOI: 10.1002/sia.3530
• 发表时间: 2011
• 期刊: Surface and Interface Analysis
• 影响因子: 1.7
• 作者: Mody J