Microanalysis and Luminescence of III-V Semiconductors

III-V 族半导体的微量分析和发光

• 批准号: 1973365
• 金额: --
• 依托单位: University of Strathclyde
• 依托单位国家: 英国
• 项目类别: Studentship
• 财政年份: 2017
• 资助国家: 英国
• 起止时间: 2017 至 无数据
• 项目状态: 已结题
• 来源: https://gtr.ukri.org/projects?ref=studentship-1973365
• 关键词: Microanalysis; Luminescence; III; Semiconductors

The project focusses on characterisation of technologically important semiconductor materials, using advanced techniques that investigate material composition, structure and optical properties at a sub-micron length scale. It is closely connected to an EPSRC Strategic Equipment Award through which a new £1M field-emission gun electron probe micro-analyser (FEG-EPMA) is being installed in the TIC building. This machine, which will be ready for operation in July 2017, will be configured for highly spatially resolved x-ray microanalysis and cathodoluminescence studies of semiconductors. The student will work with the senior researcher in charge of the electron microscope facility, and the supervisors, to utilise and extend the capabilities of the instrument. The experimental data acquired will be combined via software tools developed in the group to provide as much information as possible on the material and on the performance that can be delivered in subsequent devices. The aim is to produce original and significant results concerning the properties of a range of light-emitting semiconductor samples which will lead to a series of high-impact publications and conference presentations. A key target is the demonstration of simultaneous WDX and CL mapping on a sub-100 nm lengthscale in AlInGaN heterostructures. The samples and structures to be studied will be provided through collaborations with epitaxy specialists at Universities including Sheffield, Bath, Cambridge, Cork, Berlin and Nottingham and from industry.

该项目的重点是技术上重要的半导体材料的表征，使用先进的技术，研究材料的成分，结构和光学特性在亚微米的长度尺度。它与EPSRC战略设备奖密切相关，通过该奖项，一个新的100万英镑的场发射枪电子探针微分析仪（FEG-EPMA）正在TIC大楼安装。这台机器将于2017年7月投入使用，将被配置用于半导体的高空间分辨率X射线微分析和阴极发光研究。学生将与负责电子显微镜设施的高级研究员和主管合作，利用和扩展仪器的功能。所获得的实验数据将通过该小组开发的软件工具进行组合，以提供尽可能多的材料信息和后续设备的性能信息。其目的是产生关于一系列发光半导体样品的特性的原始和重要结果，这将导致一系列具有高影响力的出版物和会议演示。一个关键的目标是在AlInGaN异质结构中在100 nm以下的长度尺度上同时进行WDX和CL映射的演示。要研究的样品和结构将通过与包括谢菲尔德、巴斯、剑桥、科克、柏林和诺丁汉在内的大学以及工业界的外延专家合作提供。