Exploring the electrical and physical properties of 2D atomically layered materials with advanced scanning probe microscopy

使用先进的扫描探针显微镜探索二维原子层状材料的电气和物理特性

• 批准号: 2299523
• 金额: --
• 依托单位: University of Manchester
• 依托单位国家: 英国
• 项目类别: Studentship
• 财政年份: 2017
• 资助国家: 英国
• 起止时间: 2017 至 无数据
• 项目状态: 已结题
• 来源: https://gtr.ukri.org/projects?ref=studentship-2299523
• 关键词: Exploring; electrical; physical; properties; 2D

This project is in collaboration with BrukerThe aim of this project is to understand how scanning probe microscopy (SPM - also commonly called atomic force microscopy AFM) can contribute to exploring 2D / thin film materials and devices. 2D materials cover a wide range of atomically layered systems from graphene to thin films created using a range of techniques including exfoilation, chemical and physical vapour deposition. The project will primarily focus on the physical and electrical properties of 2D / thin film materials using novel imaging modes. It is frequently the case that advances in instrumentation and techniques lead to new discoveries and a greater level of understanding of the physical world in which we live. Of particular interest for this project are the new SPM modes and techniques that have recently been proposed but, as yet, are not fully explored. An example of these newer modes includes peak force tunneling atomic force microscopy (PF-TUNA) which provides nanoelectrical characterisation with the very highest spatial resolution. Comparing the electrical characteristics measured locally and non-locally on nanofabricated devices will allow the effects of the spatial distribution of physical and electronic properties to be explored in detail. In 2D / thin film materials these effects can control the macroscopic behaviour, for example, in devices that rely on tunneling even the absence of a few atoms in a barrier layer can have a significant effect allowing current to travel directly between layers rather than tunnel through the barrier. In addition, the project will explore the effects of local changes in environment, for example magnetic field or temperature, where in magnetically ordered materials large changes can be induced (e.g. through meta-magnetic phase transitions) potentially leading the way to new, multifunctional spintronic devices.

该项目的目的是了解扫描探针显微镜（SPM -通常也称为原子力显微镜AFM）如何有助于探索二维/薄膜材料和器件。二维材料涵盖了从石墨烯到薄膜的广泛的原子层状系统，这些薄膜使用了一系列技术，包括剥离、化学和物理气相沉积。该项目将主要关注使用新型成像模式的2D /薄膜材料的物理和电学特性。通常情况下，仪器和技术的进步会带来新的发现，并使我们对我们所生活的物理世界有了更深入的了解。本项目特别感兴趣的是最近提出的新的SPM模式和技术，但尚未得到充分探索。这些新模式的一个例子包括峰值力隧道原子力显微镜（PF-TUNA），它提供了具有最高空间分辨率的纳米电学表征。比较局部和非局部测量的纳米制造器件的电特性将允许详细探索物理和电子特性的空间分布的影响。在二维/薄膜材料中，这些效应可以控制宏观行为，例如，在依赖隧道的设备中，即使在阻挡层中缺少几个原子也会产生显著的影响，允许电流直接在层之间传播，而不是穿过阻挡层。此外，该项目将探索局部环境变化的影响，例如磁场或温度，在磁性有序材料中可以诱导大的变化（例如通过超磁相变），可能会导致新的多功能自旋电子器件。