Exploring the electrical and physical properties of 2D atomically layered materials with advanced scanning probe microscopy

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This project is in collaboration with BrukerThe aim of this project is to understand how scanning probe microscopy (SPM - also commonly called atomic force microscopy AFM) can contribute to exploring 2D / thin film materials and devices. 2D materials cover a wide range of atomically layered systems from graphene to thin films created using a range of techniques including exfoilation, chemical and physical vapour deposition. The project will primarily focus on the physical and electrical properties of 2D / thin film materials using novel imaging modes. It is frequently the case that advances in instrumentation and techniques lead to new discoveries and a greater level of understanding of the physical world in which we live. Of particular interest for this project are the new SPM modes and techniques that have recently been proposed but, as yet, are not fully explored. An example of these newer modes includes peak force tunneling atomic force microscopy (PF-TUNA) which provides nanoelectrical characterisation with the very highest spatial resolution. Comparing the electrical characteristics measured locally and non-locally on nanofabricated devices will allow the effects of the spatial distribution of physical and electronic properties to be explored in detail. In 2D / thin film materials these effects can control the macroscopic behaviour, for example, in devices that rely on tunneling even the absence of a few atoms in a barrier layer can have a significant effect allowing current to travel directly between layers rather than tunnel through the barrier. In addition, the project will explore the effects of local changes in environment, for example magnetic field or temperature, where in magnetically ordered materials large changes can be induced (e.g. through meta-magnetic phase transitions) potentially leading the way to new, multifunctional spintronic devices.