Defect characterisation in III-nitrides materials and devices using multimodal micro-spectroscopy

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Applying scanning electron microscopy-based electron diffraction techniques combined with photoluminescence, electroluminescence and confocal raman imaging to study structural, optical and electrical properties. In addition, this project will perform reliability and failure analysis of light emitters and detectors from deep ultraviolet to infrared wavelengths using multimodal strategies for correlation between defects and functional properties of devices.