Cortical Circuits Underlying Functional Recovery Following Stroke

项目摘要 在美国，中风是导致长期残疾的主要原因之一。从以下方面恢复 中风导致的残疾会影响患者的长期生活质量。建议的目标是 该项目旨在揭开中风后功能恢复潜在的电路机制。我们会 采用最先进的双光子成像技术相结合的创新方法 在小鼠身上进行光遗传刺激。这些方法将使我们能够监控和操纵 相同的神经纵向回路。通过这些新颖的方法，我们将测试 假设不同类别的神经元在中风康复中扮演不同的角色。我们的 方法将为确定更有效的促进中风的干预措施提供基础 通过特定细胞类型的操作恢复。

Project Summary Stroke is one of the leading causes of long-term disability in the United States. Recovery from stroke-induced disability affects patients’ long-term quality of life. The goal of the proposed project is to unravel the circuit mechanisms underlying functional recovery after stroke. We will employ innovative approaches using state-of-the-art two-photon imaging techniques combined with optogenetic stimulation in mice. These approaches will allow us to monitor and manipulate the same neural circuits longitudinally. Through these novel approaches, we will test the hypothesis that different classes of neurons have different roles in stroke recovery. Our approach will provide the basis for identifying more effective interventions that promote stroke recovery through cell-type-specific manipulation.