A dual-layer flat panel x-ray detector based on an engineered amorphous chalcogenide alloy for quantifying coronary artery calcium

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ABSTRACT Cardiovascular disease (CVDs) are the leading cause of death globally. According to the American Heart Association, for early treatment of CVD and to verify if a patient should be prescribed statin therapy, calcium scoring via cardiac Computed Tomography (CT) should be performed. However, there is a limited application of calcium scoring due to limited spatial resolution of CT (~1 mm), dose concern, and out of pocket expense for patient. To address the challenges with CT calcium scoring, a new technology based on dual-layer flat panel detector is being developed under our R01 “A dual-layer flat panel X-ray detector based on an engineered amorphous chalcogenide alloy for quantifying coronary artery calcium” to provide opportunistic calcium score whenever X-ray is done. This technology aims to provide an opportunistic approach to X-ray imaging with a detector that improves detection and quantification of coronary artery calcium (CAC). It is based on a patent pending selenium alloy with favorable optical and electrical properties that enhance image quality. Whenever X- ray is done for any reason calcium score automatically is generated with no additional cost burden to healthcare system. To advance the proposed technology from a functioning prototype to readiness level required for licensing to the Original Equipment Manufacturer (OEM), there are areas related to uniformity and variation across detector and yield that should be evaluated and assessed. In this supplement, we will apply our learning from concept to clinic: commercializing innovation (C3i) program to address key areas that are not included in the parent award but needs to be address before being presented to OEM partner. We will develop multiple prototypes to assess the distribution of bad pixels and overall detector yield, as well as identifying any patterns or trends in the distribution of these defects. We will determine the required changes or challenges in integration of the proposed technology to the OEM thin-film transistor backplanes. Leveraging the outcome of this supplement award will significantly strengthen the preliminary data required to address important technical risk related to manufacturing process of the proposed technology to present to OEM partners.