NEW BIOIMPEDANCE TECHNIQUE FOR EPIDURAL BLOCKADE

用于硬膜外阻滞的新生物阻抗技术

• 批准号: 2023231
• 负责人: DWAYNE R WESTENSKOW
• 金额: $ 10万
• 依托单位: AXON MEDICAL, INC.
• 依托单位国家: 美国
• 财政年份: 1997
• 资助国家: 美国
• 起止时间: 1997-05-01 至 1997-10-31
• 项目状态: 已结题
• 来源: https://reporter.nih.gov/project-details/2023231
• 关键词: biomedical equipment development; clinical biomedical equipment; electrical impedance; electrodes; epidural anesthesia; fluorocarbon polymers; fluoroscopy; hypodermic needle; medical complication; swine

The plan is to develop a new technique for epidural blockade using an objective measure. The current "loss of resistance" technique depends on subjective feel of the anesthesiologist. Misinterpretation of this feel can result in complications such as dural puncture and misplacement of the needle tip. The spinal cord ends at L1 or L2. During puncture above this level may cause irreversible damage to the spinal cord. The electrical resistance of the epidural space in higher than the overlying ligaments. The electrical resistance of the epidural space in higher than the overlying ligaments. The epidural space can be identified by a sudden increase in tissue impedance. To measure the tissue impedance, a constant current will be passed between an epidural needle and a reference electrode. The configuration of the electrode will be used to identify the epidural space. The impedance technique will be considered effective if the time to start surgery can be shortened. Misplacement can be recognized immediately and the needle reinserted. It will not be necessary to wait to see whether the block works and repeat the procedure if not. We expect to see a reduction in the rate of complications, (dural puncture, failed blocks, etc).

该计划是开发一种硬膜外阻滞新技术，使用 客观衡量。 目前的“电阻损失”技术取决于 麻醉师的主观感觉。 对这种感觉的误解 可能会导致硬膜穿刺、硬膜错位等并发症 针尖。 脊髓终止于 L1 或 L2。 穿刺时高于此 水平可能会对脊髓造成不可逆转的损害。 硬膜外腔的电阻高于硬膜外腔的电阻 覆盖韧带。 硬膜外腔的电阻 高于上面的韧带。 可识别硬膜外腔 组织阻抗突然增加。 为了测量组织阻抗， 恒定电流将在硬膜外针和 参比电极。 电极的配置将用于 识别硬膜外腔。 如果启动时间足够，则阻抗技术将被认为是有效的 可以缩短手术时间。 可以立即识别错位并 针重新插入。 无需等待即可查看是否 块有效，如果无效则重复该过程。 我们预计会看到减少 并发症发生率（硬脑膜穿刺、阻滞失败等）。