High Efficiency Silicon Detectors for Synchrotron XRF

用于同步加速器 XRF 的高效硅探测器

• 批准号: 6790808
• 负责人: Carolyn Rossington Tull
• 金额: $ 37.95万
• 依托单位: PHOTON IMAGING, INC.
• 依托单位国家: 美国
• 财政年份: 2004
• 资助国家: 美国
• 起止时间: 2004-09-01 至 2006-08-31
• 项目状态: 已结题
• 来源: https://reporter.nih.gov/project-details/6790808
• 关键词: X ray; X ray spectrometry; biomedical equipment development; biosensor device; electromagnetic radiation; radiofluorescent probe; silicon; synchrotrons

DESCRIPTION (provided by applicant): We will develop a new x-ray spectrometer, based on novel high efficiency silicon x-ray detectors; with good energy resolution and high count rate capability for synchrotron x-ray fluorescence (XRF) applications. In Phase I, we extended the very successful silicon drift detector design, currently fabricated on thin 0.3 mm thick substrates, into the realm of thick detectors (up to 1.5 mm thick). This added thickness is critical in extending the x-ray absorption capability of the detectors from 15 keV to 40 keV. Synchrotron XRF techniques are becoming essential tools for biological, chemical and materials analysis. Third generation synchrotrons, such as the Advanced Photon Source (APS), have photon flux brilliance in the 6-40 keV region that allow efficient x-ray fluorescence analysis with probe sizes of a micrometer and below. All of these beam-lines require high-count rate, good energy resolution energy dispersive x-ray detectors that have efficient absorption up to 40 keV. The new, thicker drift detectors will have the advantages of non-cryogenic cooling, good energy resolution, and an order of magnitude improvement in count rates compared with conventional silicon and germanium XRF detectors, while providing a significant increase in efficiency above 10 keV. The Phase II work will include the optimization of the thick detector prototypes including increase in area from 20 mm2 to 50 mm2; improve the yield and design of the process for transfer to a commercial silicon foundry. The detectors will be evaluated with respect to noise, energy resolution, and efficiency and count rate capability in response to x-rays in the 5-60 keV range. The best devices will be selected to be incorporated into a three-channel x-ray spectrometer. The spectrometer will be custom-designed and evaluated in a hard x-ray microprobe application at the Advanced Photon Source at Argonne National Laboratory, in collaboration with APS staff. The commercial applications for such high efficiency spectrometers include chemical analysis in steel, materials, chemical, geological and biological applications.

描述（由申请人提供）： 我们将开发一种基于新型高效硅X射线探测器的新型X射线光谱仪；具有良好的能量分辨率和高计数率能力，适用于同步加速器 X 射线荧光 (XRF) 应用。在第一阶段，我们将非常成功的硅漂移探测器设计（目前在 0.3 毫米厚的薄基板上制造）扩展到厚探测器领域（厚度可达 1.5 毫米）。这种增加的厚度对于将探测器的 X 射线吸收能力从 15 keV 扩展到 40 keV 至关重要。同步加速器 XRF 技术正在成为生物、化学和材料分析的重要工具。第三代同步加速器，例如高级光子源 (APS)，在 6-40 keV 区域具有亮度的光子通量，可以使用微米及以下的探针尺寸进行高效的 X 射线荧光分析。所有这些光束线都需要高计数率、良好能量分辨率的能量色散 X 射线探测器，其有效吸收高达 40 keV。与传统的硅和锗 XRF 探测器相比，新型更厚的漂移探测器将具有非低温冷却、良好的能量分辨率以及计数率提高一个数量级的优点，同时效率显着提高到 10 keV 以上。 第二阶段的工作将包括厚探测器原型的优化，包括将面积从 20 mm2 增加到 50 mm2；提高转移到商业硅铸造厂的工艺的产量和设计。探测器将在噪声、能量分辨率以及响应 5-60 keV 范围内的 X 射线的效率和计数率能力方面进行评估。将选择最好的设备并入三通道 X 射线光谱仪。该光谱仪将与 APS 工作人员合作，在阿贡国家实验室先进光子源的硬 X 射线微探针应用中进行定制设计和评估。这种高效光谱仪的商业应用包括钢铁、材料、化学、地质和生物应用中的化学分析。