Interaction of charged particles with condensed media and surfaces

研究的一般领域涉及材料科学研究，使用离子束激发技术进行结构和成分分析，特别侧重于表面和界面性质作为生长/制造参数的函数。主要项目是：(I)正在考虑用于未来微电子应用的高k介电材料的研究，特别是含有Gd、Hf等的硅酸盐材料；(Ii)利用带电粒子束的新的绝对表面分析技术的发展，能够同时具有高深度分辨率和单层灵敏度。后者涉及检查/测量带电粒子穿透凝聚介质时的相互作用概率的基础研究：例如，它们的减速速率、散射概率、核反应速率、X射线发射概率、电荷状态概率……这些研究对几个科学领域(物理、化学、地球科学、电气工程等)都很重要。这往往需要对具有技术和环境重要性的材料的成分参数进行定量测量。

The general area of research relates to materials science studies using ion beam excitation techniques for both structural and compositional analyses, focusing particularly on surface and interface properties as functions of growth/fabrication parameters.  The primary projects are:  (i)  studies of high-k dielectric materials that are being considered for future microelectronic applications, specifically silicate materials incorporating Gd, Hf, ...;  (ii) the development of novel absolute surface analytical techniques using charged particle beams, capable of both high depth resolution and monolayer sensitivity.  The latter objective involves fundamental studies to examine/measure the interaction probabilities as charged particles penetrate into condensed media:  e.g. their slowing down rate, scattering probabilities, nuclear reaction rates, X-ray emission probabilities, charge state probabilities, ...  These studies are important to several areas of science (physics, chemistry, earth sciences, electrical engineering, etc.) that frequently require quantitative measurements of compositional parameters for technologically and environmentally important materials.