Interaction of charged particles with condensed media and surfaces

一般研究领域涉及材料科学研究，使用离子束激发技术进行结构和成分分析，特别关注表面和界面特性作为生长/制造参数的函数。主要项目是：(i)正在考虑用于未来微电子应用的高k介电材料的研究，特别是含有Gd、Hf、…的硅酸盐材料；（ii）利用带电粒子束开发新的绝对表面分析技术，具有高深度分辨率和单层灵敏度。后一个目标涉及基础研究，以检查/测量带电粒子进入凝聚态介质时的相互作用概率：例如它们的减速率、散射概率、核反应速率、x射线发射概率、电荷状态概率……这些研究对一些科学领域（物理、化学、地球科学、电气工程等）很重要，这些领域经常需要对技术上和环境上重要的材料的组成参数进行定量测量。

The general area of research relates to materials science studies using ion beam excitation techniques for both structural and compositional analyses, focusing particularly on surface and interface properties as functions of growth/fabrication parameters.  The primary projects are:  (i)  studies of high-k dielectric materials that are being considered for future microelectronic applications, specifically silicate materials incorporating Gd, Hf, ...;  (ii) the development of novel absolute surface analytical techniques using charged particle beams, capable of both high depth resolution and monolayer sensitivity.  The latter objective involves fundamental studies to examine/measure the interaction probabilities as charged particles penetrate into condensed media:  e.g. their slowing down rate, scattering probabilities, nuclear reaction rates, X-ray emission probabilities, charge state probabilities, ...  These studies are important to several areas of science (physics, chemistry, earth sciences, electrical engineering, etc.) that frequently require quantitative measurements of compositional parameters for technologically and environmentally important materials.