Essential repair to particle sizer

对粒度仪进行必要的维修

• 批准号: 374990-2009
• 负责人: Corrigan, John
• 金额: $ 1万
• 依托单位: University of Western Ontario
• 依托单位国家: 加拿大
• 项目类别: Research Tools and Instruments - Category 1 (<$150,000)
• 财政年份: 2008
• 资助国家: 加拿大
• 起止时间: 2008-01-01 至 2009-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=412054
• 关键词: Essential; repair; particle; sizer

This application is to support and advance research programs in semiconductor and magnetic nanomaterials. Access to a particle sizer will permit characterization of these materials in solution using dynamic light scattering techniques. As the properties of the materials depend on their size, accurate and rapid determination of particle dimensions is of paramount importance for the development the programs. The determination of size by light scattering methods is an effective and simple method to achieve this goal.

该应用程序旨在支持和推进半导体和磁性纳米材料的研究项目。使用粒度分析仪将允许使用动态光散射技术对溶液中的这些材料进行表征。由于材料的特性取决于其尺寸，因此准确而快速地确定颗粒尺寸对于程序的开发至关重要。光散射法测定尺寸是实现这一目标的有效且简单的方法。