analytical electron microscope (asem) for research and training in textural and chemical analysis

对合成和自然样品进行详细的化学和质地分析，对于开发先进的工程材料以及我们对地球和类地行星的了解至关重要。电子显微镜是用来提供这种信息的一系列现代仪器之一。1982年，多伦多大学地质系购买了带有固态X射线探测器的JEOL JSM-840电子显微镜，这是一个能够提供高空间分辨率成分信息的系统。自那时以来，该仪器一直提供高质量的数据，以支持各种研究，并发表了大量出版物和论文。JSM-840现已投入使用第二十七年，急需更换。这一工具不可避免地会被淘汰，这将要求用户从费用更高、更难进行常规访问的设施获取相同的数据。这将大大降低研究的进度，以及我们培训学生掌握一项重要分析技术的能力。正在申请资金购买新的扫描电子显微镜，最近升级的成像和X射线分析硬件可以与之对接。因此，新仪器将结合最先进的成像和用户友好的数据采集界面，促进研究效率并提供高质量的培训体验。

Detailed chemical and textural analysis of synthetic and natural samples is central to the development of advanced engineered materials as well as to our understanding of the Earth and terrestrial planets. The electron microscope is one of a family of modern instruments used to provide this information. In 1982, the Department of Geology at the University of Toronto purchased a JEOL JSM-840 electron microscope with a solid-state x-ray detector, which is a system capable of providing compositional information with a high degree of spatial resolution. Since then, that instrument has consistently produced high quality data in support of diverse research that has resulted in a large number of publications and theses. The JSM-840 is now in its twenty-seventh year of operation and is in urgent need of replacement. The inevitable demise of this instrument will require users to obtain the same data from facilities which are both more expensive and more difficult to access routinely. This will significantly degrade the progress of research, and our ability to train students in an important analytical technique. Funds are being requested to purchase a new SEM, to which recently upgraded imaging and x-ray analysis hardware can be interfaced. Thus enhanced, the new instrument will combine state-of-the-art imaging with a user-friendly data acquistion interface, facilitating research productivity and providing a high quality training experience.