New experimental-analytical x-ray diffraction technique for unambiguous non-destructive characterization of high-performance silicon-germanium-carbon alloys for broadband communication devices

新的实验分析 X 射线衍射技术可对宽带通信设备用高性能硅-锗-碳合金进行明确的无损表征

• 批准号: ARC : DP0208979
• 负责人: Dr Andrei Nikulin
• 金额: $ 12.7万
• 依托单位: Monash University
• 依托单位国家: 澳大利亚
• 项目类别: Discovery Projects
• 财政年份: 2002
• 资助国家: 澳大利亚
• 起止时间: 2002-01-01 至 2006-12-31
• 项目状态: 已结题
• 来源: https://researchdata.edu.au/new-experimental-analytical-communication-devices/71239
• 关键词: New; experimental; analytical; ray; diffraction

New experimental-analytical x-ray diffraction technique for unambiguous non-destructive characterization of high-performance silicon-germanium-carbon alloys for broadband communication devices. This research will develop a new x-ray diffraction technique for characterization of silicon-germanium-carbon semiconductor alloys. These are the basis for the new generation, ultra-high speed broadband telecommunication devices. The research will establish a new theoretical methodology for fundamental studies of x-ray scattering phenomena in compound strain-compensated materials. The experiments will be carried out using the state-of-the-art laboratory and synchrotron radiation facilities in Australia, Japan and France. The project involves direct collaboration with IHP Germany, the world-leading semiconductor developer. Highly qualified postgraduate students will be extensively trained in modern synchrotron experiments, x-ray diffraction theory and semiconductor technology during the project.

用于宽带通信设备用高性能硅锗碳合金的明确非破坏性表征的新实验分析x射线衍射技术。这项研究将发展一种新的x射线衍射技术来表征硅锗碳半导体合金。这些是新一代超高速宽带电信设备的基础。该研究将为复合应变补偿材料中X射线散射现象的基础研究建立一种新的理论方法。这些实验将利用澳大利亚、日本和法国的最先进的实验室和同步加速器辐射设施进行。该项目涉及与世界领先的半导体开发商IHP德国的直接合作。高素质的研究生将在项目期间接受现代同步加速器实验，x射线衍射理论和半导体技术的广泛培训。