Scanning electron microscope replacement

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The electron microscope has, no doubt, been the greatest invention of the 20th century. One of the latest developments in the field of electron microscopy is the variable pressure scanning electron microscope. This equipment allows samples to be introduced into the instrument and viewed as received, under a low vacuum setting, without any lengthy sample preparation time such as 'critical point drying' for biological specimens, and non-conductive materials can be analyzed without coating with gold or other conductive alloys. This is a tremendous advantage over conventional SEM as it eliminates the possibility of introducing artifacts in the SEM preparations. The current proposal is for the acquisition of an entry level benchtop SEM with variable observations modes: high vacuum (conventional viewing), and low vacuum (minimal to no preparation). The benchtop model offers many advantages such as lower price and reduced cost of operation due to its compact size. The 'variable pressure' feature of the equipment does not require the use of critical point drying equipment, as well as other instrumentation such as vacuum evaporators and sputter coaters, further contributing to the reduced costs of operation when viewing a large number of samples. The current research programs of the applicants make extensive use of scanning electron microscopy and is crucial for the further development of their research programs. The bulk of the research will be performed by graduate and undergraduate students under the direct supervision of the applicants. Many of these students have (and will) go on to careers in research in industry and academia. For these students, the ability to utilize a piece of equipment commonly in use in the biological and materials sciences will be invaluable.