Development of new technologies for the characterization of materials at high spatial resolution in field emission scanning electron microscopy

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Scanning electron microscope (SEM) manufacturer continue to push the capability of the SEM, improve the electron detectors and develop novel attachments. What is missing to start a new era in microscopy are examples of application and development of new analysis techniques that use this new development from SEM manufacturer like Hitachi Canada. This CRD research proposal proposes specific applications, to improve and develop analysis techniques by combining the applicant expertise and Hitachi Canada new SEM capabilities and know-how. This proposal aim to address four problems: one problem of developing new nanoscale materials is to know accurately the composition of each small feature; high resolution imaging and composition analysis of biological and soft materials with nanoscale treating agents or nano-fillers like CNT; surface contamination and damage to observe the true surface of materials by using any of the available electron and x-ray detectors to assess their microstructure; understanding of the mechanical properties of nano-materials during the experiment, i.e., in-situ observation and characterization.