Quantitative Analysis of the Microstructure of Materials with new techniques in the Electron Microscope

电子显微镜新技术定量分析材料微观结构

• 批准号: 121420-2013
• 负责人: Gauvin, Raynald
• 金额: $ 3.21万
• 依托单位: McGill University
• 依托单位国家: 加拿大
• 项目类别: Discovery Grants Program - Individual
• 财政年份: 2014
• 资助国家: 加拿大
• 起止时间: 2014-01-01 至 2015-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=545314
• 关键词: Quantitative; Analysis; Microstructure; Materials; new

The Gauvin group is one of the leading groups in the world in modeling and improving the understanding of electron beam interaction with solids for the development of new quantitative methods in the electron microscope. This research proposal is to put the Gauvin group to the next level in electron microscopy, allowing them to design the next generation of electron microscopes and also to develop new computer simulations methods to characterize the microstructure of materials at high spatial resolution. Computer simulations of electron trajectories in the electromagnetic field will be used to develop a new optimal electron microscope that will operate in the 0.1 - 60 keV range. A new standardless quantitative procedure for X-ray microanalysis in electron microscopy, for real materials, will be developed with the measurement of Coster-Kronig transition factors using a new method. This will allow the development of a new 3 dimensional nano scale analyses of x-ray date by electron tomography in the field emission transmission electron microscope (FE-TEM). A new Monte Carlo program to simulate electron channeling in bulk materials with dislocations will be developed. It will be applied to improve the understanding of dislocation structure on the fatigue of metals. The Pychographycal method will be implemented for improving ultimate resolution in scanning tramsmission electron microscope (STEM). A new method to determine the bound structure of materials with electron backscattered difraction (EBSD) in the STEM mode is proposed. Since more than 100 000 scientific papers that were published since 1990 that are related to nanotechnology used an electron microscope, it is clear that any advance in electron microscopy will have a significant impact in science and technology.

高文小组是世界领先的小组之一，致力于对电子束与固体的相互作用进行建模和提高对电子束与固体相互作用的理解，以开发电子显微镜中的新定量方法。这项研究计划旨在将高文小组在电子显微镜领域提升到一个新的水平，使他们能够设计下一代电子显微镜，并开发新的计算机模拟方法，以高空间分辨率表征材料的微观结构。电磁场中电子轨迹的计算机模拟将用于开发一种新的最佳电子显微镜，该显微镜将在 0.1 - 60 keV 范围内运行。通过使用新方法测量 Coster-Kronig 转变因子，将开发一种用于电子显微镜中针对真实材料的 X 射线微量分析的新无标定量程序。这将允许通过场发射透射电子显微镜 (FE-TEM) 中的电子断层扫描技术开发新的 3 维纳米级 X 射线数据分析。将开发一种新的蒙特卡罗程序来模拟带位错的块状材料中的电子沟道。它将应用于提高对位错结构对金属疲劳影响的理解。将采用 Pychographycal 方法来提高扫描透射电子显微镜 (STEM) 的最终分辨率。提出了一种在 STEM 模式下利用电子背散射衍射 (EBSD) 确定材料束缚结构的新方法。自 1990 年以来，已有超过 10 万篇与纳米技术相关的科学论文使用了电子显微镜，因此很明显，电子显微镜的任何进步都会对科学技术产生重大影响。