Design for electromigration: modeling for reliable metallization and optimal operation
电迁移设计:可靠金属化和最佳运行建模
基本信息
- 批准号:517021-2018
- 负责人:
- 金额:$ 1.53万
- 依托单位:
- 依托单位国家:加拿大
- 项目类别:Postgraduate Scholarships - Doctoral
- 财政年份:2019
- 资助国家:加拿大
- 起止时间:2019-01-01 至 2020-12-31
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
electromigration, multiscale model, reliability, time to failure, interconnects, integrated circuits (ICs), physical design and layout, printed circuit boards (PCBs), thermomigration, microelectronics
电迁移、多尺度模型、可靠性、故障时间、互连、集成电路(IC)、物理设计和布局、印刷电路板(PCB)、热迁移、微电子学
项目成果
期刊论文数量(0)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
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Joshi, Surabhi其他文献
Comparative Evaluation of the Remineralizing Potential of Commercially Available Agents on Artificially Demineralized Human Enamel: An In vitro Study
- DOI:
10.4103/ccd.ccd_679_18 - 发表时间:
2019-10-01 - 期刊:
- 影响因子:1.2
- 作者:
Joshi, Chintan;Gohil, Uma;Joshi, Surabhi - 通讯作者:
Joshi, Surabhi
Biphasic Calcium Phosphate Versus Demineralized Freeze-Dried Bone Allograft in the Treatment of Periodontal Disease: A Clinical and Radiographical Evaluation.
- DOI:
10.7759/cureus.29131 - 发表时间:
2022-09 - 期刊:
- 影响因子:1.2
- 作者:
Kumar, Santosh;Desai, Nahid;Joshi, Surabhi;Hirani, Tanvi;Gajjar, Shreya;Patel, Chandni;Bhakkand, Sushmita R.;Girdhar, Gaurav A.;Govindool, Sharaschandra R.;Fakuradzi, Wan Farizatul Shima Wan Ahmad;Haque, Mainul - 通讯作者:
Haque, Mainul
Identifying Gingival Pigmentation Patterns and Skin Color and Its Co-relation With Serum Ferritin Levels in Thalassemic Patients.
- DOI:
10.7759/cureus.28015 - 发表时间:
2022-08 - 期刊:
- 影响因子:1.2
- 作者:
Gajjar, Shreya;Kaur, Harjot;Girdhar, Gaurav;Kaur, Ashish;Patel, Chandni;Mehta, Rupal;Bhakkand, Sushmita;Hirani, Tanvi;Joshi, Surabhi;Irfan, Mohammed;Fakuradzi, Wan Farizatul Shima Binti Wan Ahmad;Sinha, Susmita;Haque, Mainul;Kumar, Santosh - 通讯作者:
Kumar, Santosh
Joshi, Surabhi的其他文献
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{{ truncateString('Joshi, Surabhi', 18)}}的其他基金
Design for electromigration: modeling for reliable metallization and optimal operation
电迁移设计:可靠金属化和最佳运行建模
- 批准号:
517021-2018 - 财政年份:2020
- 资助金额:
$ 1.53万 - 项目类别:
Postgraduate Scholarships - Doctoral
Design for electromigration: modeling for reliable metallization and optimal operation
电迁移设计:可靠金属化和最佳运行建模
- 批准号:
517021-2018 - 财政年份:2018
- 资助金额:
$ 1.53万 - 项目类别:
Postgraduate Scholarships - Doctoral
相似海外基金
Effect of electromigration on corrosion and mass transfer in high-temperature liquid metals
电迁移对高温液态金属腐蚀和传质的影响
- 批准号:
23K17676 - 财政年份:2023
- 资助金额:
$ 1.53万 - 项目类别:
Grant-in-Aid for Challenging Research (Exploratory)
Innovation of electromigration-driven fine-injection method for nanowire scaling up
用于纳米线放大的电迁移驱动精细注射方法的创新
- 批准号:
23H01300 - 财政年份:2023
- 资助金额:
$ 1.53万 - 项目类别:
Grant-in-Aid for Scientific Research (B)
SHF:Small: Learning-based Fast Analysis and Fixing for Electromigration Damage
SHF:Small:基于学习的电迁移损伤快速分析和修复
- 批准号:
2305437 - 财政年份:2023
- 资助金额:
$ 1.53万 - 项目类别:
Standard Grant
The mechanism of electromigration studied by real-time ultrasound monitoring for single nanowire
单根纳米线实时超声监测研究电迁移机理
- 批准号:
22H01908 - 财政年份:2022
- 资助金额:
$ 1.53万 - 项目类别:
Grant-in-Aid for Scientific Research (B)
Electromigration for high-temperature interface control
用于高温界面控制的电迁移
- 批准号:
21K18807 - 财政年份:2021
- 资助金额:
$ 1.53万 - 项目类别:
Grant-in-Aid for Challenging Research (Exploratory)
SHF:Small: Machine Learning Approach for Fast Electromigration Analysis and Full-Chip Assessment
SHF:Small:用于快速电迁移分析和全芯片评估的机器学习方法
- 批准号:
2007135 - 财政年份:2020
- 资助金额:
$ 1.53万 - 项目类别:
Standard Grant
Design for electromigration: modeling for reliable metallization and optimal operation
电迁移设计:可靠金属化和最佳运行建模
- 批准号:
517021-2018 - 财政年份:2020
- 资助金额:
$ 1.53万 - 项目类别:
Postgraduate Scholarships - Doctoral
Custom Tool to Produce and Test Micro Dog-bone Solder Specimen for Electromigration
用于生产和测试电迁移微型狗骨焊料样本的定制工具
- 批准号:
539570-2019 - 财政年份:2019
- 资助金额:
$ 1.53万 - 项目类别:
University Undergraduate Student Research Awards
Design for electromigration: modeling for reliable metallization and optimal operation
电迁移设计:可靠金属化和最佳运行建模
- 批准号:
517021-2018 - 财政年份:2018
- 资助金额:
$ 1.53万 - 项目类别:
Postgraduate Scholarships - Doctoral
Understanding the Effect of Ordered Twinning on Electromigration Failure in Advanced Metallic Interconnects
了解有序孪晶对先进金属互连中电迁移失效的影响
- 批准号:
1807686 - 财政年份:2018
- 资助金额:
$ 1.53万 - 项目类别:
Standard Grant














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