Ultraviolet, visible and infrared spectroscopic ellipsometers for advanced materials and device characterisation

用于先进材料和器件表征的紫外、可见和红外光谱椭偏仪

• 批准号: LE110100169
• 负责人: Prof Heike Ebendorff-Heidepriem
• 金额: $ 20万
• 依托单位: The University of Adelaide
• 依托单位国家: 澳大利亚
• 项目类别: Linkage Infrastructure, Equipment and Facilities
• 财政年份: 2011
• 资助国家: 澳大利亚
• 起止时间: 2011-01-01 至 2011-12-31
• 项目状态: 已结题
• 来源: https://dataportal.arc.gov.au/RGS/Web/Grants/LE110100169
• 关键词: Ultraviolet; visible; infrared; spectroscopic; ellipsometers

The ellipsometers at this facility will enable optical characterisation of several advanced materials in the wide spectral range of 250 nanometres - 30 micrometres. As well as refractive index and thickness measurement, they will provide absorption spectroscopy which will allow assessment of novel glasses and surface functionalisation approaches for the optimisation of new sensing technologies.

该设施的椭偏仪将能够在250纳米至30微米的宽光谱范围内对几种先进材料进行光学表征。除了折射率和厚度测量外，它们还将提供吸收光谱，这将允许评估新型玻璃和表面功能化方法，以优化新的传感技术。